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» Тема, жанр, tags: Semiconductors,Reliability,Extreme environments,Environmental testing
Semiconductor devices in harsh conditions
pdf
Author:
Chrzanowska-Jeske Malgorzata
,
Weide-Zaage Kirsten
Language:
English
Year:
2017
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27.01.2024
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Challenges of Concrete Construction: Volume 6, Concrete for Extreme Conditions: Proceedings of the International Conference Held at the University of ... UK on 9-11 September 2002
pdf
Author:
Newlands Moray D.
,
Dhir Ravindra K.
,
McCarthy Michael John
Language:
English
Year:
2002
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0
27.01.2024
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