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» Тема, жанр, tags: Characterization and Evaluation of Materials,Optical and Electronic Materials,Analytical Chemistry » Page 301
Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis
djvu
Author:
John H. Thomas III (auth.) Alvin W. Czanderna Theodore E. Madey Cedric J. Powell (eds.)
Language:
English
Year:
2002
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0
26.01.2024
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An Introduction to Computational Micromechanics: Corrected Second Printing
djvu
Author:
Tarek I. Zohdi Peter Wriggers (auth.) Tarek I. Zohdi Peter Wriggers (eds.)
Language:
English
Year:
2005
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0
26.01.2024
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Delamination Buckling of Composite Materials
djvu
Author:
L. M. Kachanov (auth.)
Language:
English
Year:
1988
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