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Online Library TheLib.net » Book serie: / Книги серии: Frontiers in Electronic Testing » Page 5

book Fault Diagnosis of Analog Integrated Circuits

Fault Diagnosis of Analog Integrated Circuits

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Author: Prithviraj Kabisatpathy Alok Barua Satyabroto Sinha
Language: English
Year: 2005

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27.01.2024

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book Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault

Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault

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Author: Joan Figueras Rosa Rodríguez-Montañés Daniel Arumí (auth.) Hans-Joachim Wunderlich (eds.)
Language: English
Year: 2010

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27.01.2024

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book CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

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Author: Andrei Pavlov Manoj Sachdev
Language: English
Year: 2008

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27.01.2024

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book Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing)

Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing)

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Author: Adam Osseiran
Language: English
Year: 1999

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27.01.2024

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book Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

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Author: Jose Nazario
Language: English
Year: 2007

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27.01.2024

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book High Performance Memory Testing Design Principles Fault Modeling

High Performance Memory Testing Design Principles Fault Modeling

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Author: R. Dean Adams
Language: English
Year: 2002

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26.01.2024

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book Advances in Electronic Testing Challenges and Methodologies

Advances in Electronic Testing Challenges and Methodologies

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Author: Dimitris Gizopoulos
Language: English
Year: 2006

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26.01.2024

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book A Designer s Guide to Built-in Self-Test

A Designer s Guide to Built-in Self-Test

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Author: Charles E. Stroud
Language: English
Year: 2002

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26.01.2024

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book Data mining and diagnosing IC fails

Data mining and diagnosing IC fails

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Author: Leendert M. Huisman
Language: English
Year: 2005

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26.01.2024

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book Power-Constrained Testing Of Vlsi Circuits

Power-Constrained Testing Of Vlsi Circuits

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Author: Richard J. Peterson
Language: English
Year: 2000

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26.01.2024

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