Ebook: Encyclopedia of Materials Characterization - Surfaces, Interfaces, Thin Films

This is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the series.
Content:
• Front Matter
• Preface to Series
• Preface
• Acronyms Glossary
• Table of Contents
1. Introduction and Summaries
2. Imaging Techniques (Microscopy)
3. Electron Beam Instruments
4. Structure Determination by Diffraction and Scattering
5. Electron Emission Spectroscopies
6. X-Ray Emission Techniques
7. Visible/UV Emission, Reflection, and Absorption
8. Vibrational Spectroscopies and NMR
9. Ion Scattering Techniques
10. Mass and Optical Spectroscopies
11. Neutron and Nuclear Techniques
12. Physical and Magnetic Properties
• Index