Ebook: Advances in X-Ray Analysis: Volume 33

Content:
Front Matter....Pages i-xx
High Resolution X-Ray Diffraction for the Characterization of Semiconducting Materials....Pages 1-11
X-Ray Topography of Surface Layers and Epitaxial Films....Pages 13-23
Stresses in Thin Films....Pages 25-32
Deformation, Recovery and Stress Corrosion Cracking of Nickel-Base Alloy 600 by X-Ray Rocking-Curve Measurements....Pages 33-53
X-Ray Characterisation of Residual Surface Strains after Polishing of Silicon Wafers....Pages 55-60
Measurement of Relaxation in Strained Layer Semiconductor Structures....Pages 61-66
Characterization of Structural Inhomogeneities in GaAs/AlGaAs Superlattices....Pages 67-74
X-Ray Diffraction Analysis of SiGe/Si Superlattices....Pages 75-82
High Resolution Measurement of Surface Misorientation in Single Crystal Wafers....Pages 83-90
Surface and Ultra-Thin Film Characterization by Grazing-Incidence Asymmetric Bragg Diffraction....Pages 91-100
Study of Thin Films and Multilayers using Energy-Dispersive Diffraction of Synchrotron Radiation....Pages 101-107
Effects of Refraction and Reflection on Analysis of Thin Films by the Grazing-Incidence X-Ray Diffraction Method....Pages 109-120
Enhanced Range of Measurable Thickness of Thin Crystalline Layers Using ?/2? Decoupled Powder X-Ray Diffraction....Pages 121-127
X-Ray Diffraction of Plasma Nitrided Ti-6A1-4V....Pages 129-135
A Comparative Study of Stress Determination Techniques in Polycrystalline Thin Films....Pages 137-144
X-Ray Line Broadening Analysis of Tl-Superconducting Films....Pages 145-151
Stress Analysis of Thin-Film SmS using a Seemann-Bohlin Diffractometer....Pages 153-159
Residual Stresses and Differential Deformation of Electroplated Structures....Pages 161-169
X-Ray Residual Stress Analysis of Zn-Ni Alloy Electroplating Layers....Pages 171-175
XRD Characterization of Titanium/Copper Thin Films Heat Treated in Vacuum and Hydrogen....Pages 177-187
Characterization of Thin Films Using XRF....Pages 189-195
The Determination of Elemental Composition, Thickness and Crystalline Phases in Single and Multi-Layer Thin Films....Pages 197-204
Near-Surface Chemical Characterization using Grazing Incidence X-Ray Fluorescence....Pages 205-211
Basic Studies of Multi-Layer Thin Film Analysis using Fundamental Parameter Method....Pages 213-223
Application of Multi-Layer Thin Film Analysis by X-Ray Spectrometry using the Fundamental Parameter Method....Pages 225-235
Fundamental Parameter-Based X-Ray Fluorescence Analysis of Thin and Multilayer Samples....Pages 237-245
Non-Destructive Chemical-State Analysis of Thin Films and Surface Layers (1–1000 NM) by Low-Energy Electron Induced X-Ray Spectroscopy (Leeixs)....Pages 247-259
Structure Refinements in Chemistry and Physics. A Comparative Study Using the Rietveld and the Two-Step Method....Pages 261-268
X-Ray Powder Diffraction QPA by Rietveld Pattern-Fitting - Scope and Limitations....Pages 269-275
Application of Position Sensitive Detectors for Neutron Diffraction Texture Analysis of Hematite Ore....Pages 277-283
Problems in the Derivation of d-Values from Experimental Digital XRD Patterns....Pages 285-293
Derivation of d-Values from Digitized X-Ray and Synchrotron Diffraction Data....Pages 295-303
The Optimization of Step Size While Collecting a Digitized Diffraction Pattern at a Constant Total Scan Time....Pages 305-311
XRD Acquisition Parameters for Detection of Weak Peaks....Pages 313-318
X-Ray Examination of Fracture Surfaces of Silicon Nitride Ceramics....Pages 319-326
X-Ray Residual Stress Measurement on Fracture Surface of Stress Corrosion Cracking....Pages 327-334
Time-Resolved X-Ray Stress Measurement During Cyclic Loading....Pages 335-340
Determination of Rolling Contact Stress Distribution by X-Ray Diffraction....Pages 341-352
Residual Stress Distribution of Ceramic-Metal Joint....Pages 353-362
Diffraction Plane Dependence of X-Ray Elastic Constants of Alumina....Pages 363-372
The Importance of Consistent 1/d Scans in Determining Size and Strain by Powder Diffraction Profile Analysis....Pages 373-381
The Comparison of Several Standard Materials and Techniques for the Warren-Averbach Determination of Microstructure Characteristics of Calcium Hydroxide Sorbent Materials....Pages 383-388
The Use of 2-D Detector Utilizing Laser-Stimulated Luminescence for X-Ray Diffraction Studies on Mechanical Behaviour of Materials....Pages 389-396
Correction of X-Ray Diffraction Profiles Measured by PSPC System....Pages 397-402
Strain and Particle Size of Palladium Metal Powders by Time-of-Flight Neutron Diffraction....Pages 403-407
Numerical Resolution Enhancement of X-Ray Diffraction Patterns....Pages 409-416
Standard Database Format for the Dissemination and Storage of Diffraction Data - Task Group Progress Report on JCAMP-DX....Pages 417-422
X-Ray Analysis of the Structure of Wholly Aromatic Copolyamides and Copolyester Carbonates....Pages 423-432
Polymorphism in Syndiotactic Polystyrene....Pages 433-443
Phase Diagram Studies on Neopentylglycol and Pentaerythritol-Thermal Energy Storage Materials....Pages 445-452
Crystal Chemistry and Phase Equilibria of the BaO-R2O3-CuO Systems....Pages 453-465
Measurement of the Phase Composition of Partially Stabilized Zirconia (PSZ) Test Parts by X-Ray Powder Diffraction....Pages 467-474
X-Ray Mass Absorption Coefficients: Measurements and Uses in the Quantitative Diffraction Analysis of Pyrite in Coals....Pages 475-483
An Overview of the Use of XRD as A Tool in the Total Analysis of Powdered Household Laundry Detergents....Pages 485-492
The Determination of Quartz in Perlite by X-Ray Diffraction....Pages 493-497
The Concept of Pathlength Distributions Applied to Fundamental Parameter Approach....Pages 499-508
A Versatile Fundamental Alphas Program for Use with Either Tube or Secondary Target Excitation....Pages 509-514
Absorption Corrections via Backscattered Radiation in Polychromatic Excitation Energy-Dispersive X-Ray Fluorescence Spectrometry....Pages 515-520
Intensity and Distribution of Background X-Rays in Wavelength Dispersive Spectrometry III....Pages 521-529
An Artificial Intelligence System for XRF Data on a Personal Computer....Pages 531-536
SPC: What is it and Why Should You Use it in Your X-Ray Analytical Laboratory?....Pages 537-542
SPC Analysis of Optimal Strategies for Restandardization of X-Ray Fluorescence Analyses....Pages 543-548
Analytical Errors from Electronic Instability in the Counting Chain of a Wavelength-Dispersive XRF Spectrometer....Pages 549-552
Corrections for the Effect of Scattering on XRF Intensity....Pages 553-566
XRFPC: A Program and Data Base for XRF Computations....Pages 567-572
Theoretical Estimation of the Fourth-Order XRF Intensity....Pages 573-580
TXRF Spectrometer for Trace Element Detection....Pages 581-583
A Compact On-Line XRF Analyzer for Chemical and Petrochemical Processes....Pages 585-591
XRF Macroprobe Analysis of Geologic Materials....Pages 593-601
Qualitative XRF Analysis with Pattern Recognition....Pages 603-613
Design of High Performance Soft X-Ray Windows....Pages 615-622
X-Ray Capillary Microbeam Spectrometer....Pages 623-628
The Use of Field-Portable X-Ray Fluorescence Technology in the Hazardous Waste Industry....Pages 629-637
XRF Technique as a Method of Choice for On-Site Analysis of Soil Contaminants and Waste Material....Pages 639-645
Application of Field Mobile EDXRF Analysis to Contaminated Soil Characterization....Pages 647-654
Screening of Hazardous Waste with an Energy Dispersive X-Ray Fluorescence Spectrometer....Pages 655-663
X-Ray Fluorescence Analysis of Trace Metals in the Annual Growth Layers of Freshwater Mussel Shells....Pages 665-670
Application of Pixe Method for Environmental Protection in Poland....Pages 671-672
Microvolume Analysis of Fly Ash by Synchrotron Radiation X-Ray Fluorescence (SRXRF) and Electron Microprobe X-Ray Microanalysis (EPXMA)....Pages 673-678
X-Ray Fluorescence Analysis of Zeolites for the Determination of Silica: Alumina Ratio and Soda:Alumina Ratio....Pages 679-684
Back Matter....Pages 691-704
Alumina Characterization by XRF....Pages 685-690

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Content:
Front Matter....Pages i-xx
High Resolution X-Ray Diffraction for the Characterization of Semiconducting Materials....Pages 1-11
X-Ray Topography of Surface Layers and Epitaxial Films....Pages 13-23
Stresses in Thin Films....Pages 25-32
Deformation, Recovery and Stress Corrosion Cracking of Nickel-Base Alloy 600 by X-Ray Rocking-Curve Measurements....Pages 33-53
X-Ray Characterisation of Residual Surface Strains after Polishing of Silicon Wafers....Pages 55-60
Measurement of Relaxation in Strained Layer Semiconductor Structures....Pages 61-66
Characterization of Structural Inhomogeneities in GaAs/AlGaAs Superlattices....Pages 67-74
X-Ray Diffraction Analysis of SiGe/Si Superlattices....Pages 75-82
High Resolution Measurement of Surface Misorientation in Single Crystal Wafers....Pages 83-90
Surface and Ultra-Thin Film Characterization by Grazing-Incidence Asymmetric Bragg Diffraction....Pages 91-100
Study of Thin Films and Multilayers using Energy-Dispersive Diffraction of Synchrotron Radiation....Pages 101-107
Effects of Refraction and Reflection on Analysis of Thin Films by the Grazing-Incidence X-Ray Diffraction Method....Pages 109-120
Enhanced Range of Measurable Thickness of Thin Crystalline Layers Using ?/2? Decoupled Powder X-Ray Diffraction....Pages 121-127
X-Ray Diffraction of Plasma Nitrided Ti-6A1-4V....Pages 129-135
A Comparative Study of Stress Determination Techniques in Polycrystalline Thin Films....Pages 137-144
X-Ray Line Broadening Analysis of Tl-Superconducting Films....Pages 145-151
Stress Analysis of Thin-Film SmS using a Seemann-Bohlin Diffractometer....Pages 153-159
Residual Stresses and Differential Deformation of Electroplated Structures....Pages 161-169
X-Ray Residual Stress Analysis of Zn-Ni Alloy Electroplating Layers....Pages 171-175
XRD Characterization of Titanium/Copper Thin Films Heat Treated in Vacuum and Hydrogen....Pages 177-187
Characterization of Thin Films Using XRF....Pages 189-195
The Determination of Elemental Composition, Thickness and Crystalline Phases in Single and Multi-Layer Thin Films....Pages 197-204
Near-Surface Chemical Characterization using Grazing Incidence X-Ray Fluorescence....Pages 205-211
Basic Studies of Multi-Layer Thin Film Analysis using Fundamental Parameter Method....Pages 213-223
Application of Multi-Layer Thin Film Analysis by X-Ray Spectrometry using the Fundamental Parameter Method....Pages 225-235
Fundamental Parameter-Based X-Ray Fluorescence Analysis of Thin and Multilayer Samples....Pages 237-245
Non-Destructive Chemical-State Analysis of Thin Films and Surface Layers (1–1000 NM) by Low-Energy Electron Induced X-Ray Spectroscopy (Leeixs)....Pages 247-259
Structure Refinements in Chemistry and Physics. A Comparative Study Using the Rietveld and the Two-Step Method....Pages 261-268
X-Ray Powder Diffraction QPA by Rietveld Pattern-Fitting - Scope and Limitations....Pages 269-275
Application of Position Sensitive Detectors for Neutron Diffraction Texture Analysis of Hematite Ore....Pages 277-283
Problems in the Derivation of d-Values from Experimental Digital XRD Patterns....Pages 285-293
Derivation of d-Values from Digitized X-Ray and Synchrotron Diffraction Data....Pages 295-303
The Optimization of Step Size While Collecting a Digitized Diffraction Pattern at a Constant Total Scan Time....Pages 305-311
XRD Acquisition Parameters for Detection of Weak Peaks....Pages 313-318
X-Ray Examination of Fracture Surfaces of Silicon Nitride Ceramics....Pages 319-326
X-Ray Residual Stress Measurement on Fracture Surface of Stress Corrosion Cracking....Pages 327-334
Time-Resolved X-Ray Stress Measurement During Cyclic Loading....Pages 335-340
Determination of Rolling Contact Stress Distribution by X-Ray Diffraction....Pages 341-352
Residual Stress Distribution of Ceramic-Metal Joint....Pages 353-362
Diffraction Plane Dependence of X-Ray Elastic Constants of Alumina....Pages 363-372
The Importance of Consistent 1/d Scans in Determining Size and Strain by Powder Diffraction Profile Analysis....Pages 373-381
The Comparison of Several Standard Materials and Techniques for the Warren-Averbach Determination of Microstructure Characteristics of Calcium Hydroxide Sorbent Materials....Pages 383-388
The Use of 2-D Detector Utilizing Laser-Stimulated Luminescence for X-Ray Diffraction Studies on Mechanical Behaviour of Materials....Pages 389-396
Correction of X-Ray Diffraction Profiles Measured by PSPC System....Pages 397-402
Strain and Particle Size of Palladium Metal Powders by Time-of-Flight Neutron Diffraction....Pages 403-407
Numerical Resolution Enhancement of X-Ray Diffraction Patterns....Pages 409-416
Standard Database Format for the Dissemination and Storage of Diffraction Data - Task Group Progress Report on JCAMP-DX....Pages 417-422
X-Ray Analysis of the Structure of Wholly Aromatic Copolyamides and Copolyester Carbonates....Pages 423-432
Polymorphism in Syndiotactic Polystyrene....Pages 433-443
Phase Diagram Studies on Neopentylglycol and Pentaerythritol-Thermal Energy Storage Materials....Pages 445-452
Crystal Chemistry and Phase Equilibria of the BaO-R2O3-CuO Systems....Pages 453-465
Measurement of the Phase Composition of Partially Stabilized Zirconia (PSZ) Test Parts by X-Ray Powder Diffraction....Pages 467-474
X-Ray Mass Absorption Coefficients: Measurements and Uses in the Quantitative Diffraction Analysis of Pyrite in Coals....Pages 475-483
An Overview of the Use of XRD as A Tool in the Total Analysis of Powdered Household Laundry Detergents....Pages 485-492
The Determination of Quartz in Perlite by X-Ray Diffraction....Pages 493-497
The Concept of Pathlength Distributions Applied to Fundamental Parameter Approach....Pages 499-508
A Versatile Fundamental Alphas Program for Use with Either Tube or Secondary Target Excitation....Pages 509-514
Absorption Corrections via Backscattered Radiation in Polychromatic Excitation Energy-Dispersive X-Ray Fluorescence Spectrometry....Pages 515-520
Intensity and Distribution of Background X-Rays in Wavelength Dispersive Spectrometry III....Pages 521-529
An Artificial Intelligence System for XRF Data on a Personal Computer....Pages 531-536
SPC: What is it and Why Should You Use it in Your X-Ray Analytical Laboratory?....Pages 537-542
SPC Analysis of Optimal Strategies for Restandardization of X-Ray Fluorescence Analyses....Pages 543-548
Analytical Errors from Electronic Instability in the Counting Chain of a Wavelength-Dispersive XRF Spectrometer....Pages 549-552
Corrections for the Effect of Scattering on XRF Intensity....Pages 553-566
XRFPC: A Program and Data Base for XRF Computations....Pages 567-572
Theoretical Estimation of the Fourth-Order XRF Intensity....Pages 573-580
TXRF Spectrometer for Trace Element Detection....Pages 581-583
A Compact On-Line XRF Analyzer for Chemical and Petrochemical Processes....Pages 585-591
XRF Macroprobe Analysis of Geologic Materials....Pages 593-601
Qualitative XRF Analysis with Pattern Recognition....Pages 603-613
Design of High Performance Soft X-Ray Windows....Pages 615-622
X-Ray Capillary Microbeam Spectrometer....Pages 623-628
The Use of Field-Portable X-Ray Fluorescence Technology in the Hazardous Waste Industry....Pages 629-637
XRF Technique as a Method of Choice for On-Site Analysis of Soil Contaminants and Waste Material....Pages 639-645
Application of Field Mobile EDXRF Analysis to Contaminated Soil Characterization....Pages 647-654
Screening of Hazardous Waste with an Energy Dispersive X-Ray Fluorescence Spectrometer....Pages 655-663
X-Ray Fluorescence Analysis of Trace Metals in the Annual Growth Layers of Freshwater Mussel Shells....Pages 665-670
Application of Pixe Method for Environmental Protection in Poland....Pages 671-672
Microvolume Analysis of Fly Ash by Synchrotron Radiation X-Ray Fluorescence (SRXRF) and Electron Microprobe X-Ray Microanalysis (EPXMA)....Pages 673-678
X-Ray Fluorescence Analysis of Zeolites for the Determination of Silica: Alumina Ratio and Soda:Alumina Ratio....Pages 679-684
Back Matter....Pages 691-704
Alumina Characterization by XRF....Pages 685-690
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