Ebook: Forces in Scanning Probe Methods

The invention of scanning tunneling microscopy, atomic force microscopy and near field optical microscopy has opened up a new field of research: scanning probe methods (SMP). The quality of image acquisition has made great strides in recent times, but many fundamental, unsolved problems remain unanswered about the interaction between probe tip and sample.
Forces in Scanning Probe Methods contains 60 contributions dedicated to these problems. Most of the contributions are reviews, presenting condensed, relevant information, suitable for both students and specialists. The contributions cover the instrumental aspects and design of force microscopes in different environments (ambient pressure, low temperature, ultrahigh vacuum, liquids). Theory is also covered, including abinitio calculations and molecular dynamics simulations. Mechanical properties at micro and nanoscales receive intensive treatment, including adhesion, friction and wear: the friction phenomenon is one of the most hotly debated questions.
Other highlights include advances in near field optical microscopy and its relation to forces, the application of force microscopy in NMR, and the observance of flux lines in high T_c superconductors. Recent advances in biology and chemistry also attract attention.

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Content:
Front Matter....Pages i-xiii
The Nanometer Age: Challenge and Chance....Pages 1-13
Scanning Probe Microscopy Instrumentation....Pages 15-34
Low Temperature Scanning Force Microscopy....Pages 35-62
Measuring Ultrafast Voltage Signals Using a Scanning Force Microscope....Pages 63-68
Oscillating String as a Force Sensor in Scanning Force Microscopy....Pages 69-78
Electrostatically Actuated Silicon Micromachined Sensors for Scanning Force Microscopy....Pages 79-84
Effect of Overlayer Thickness on the Nanoindentation of SiO2 /Si....Pages 85-90
Nanostethoscopy: A New Mode of Operation of the Atomic Force Microscope....Pages 91-97
A Multi-Test Instrument Based on Scanning Probe Technologies....Pages 99-104
Hydrophobic Surface Interactions Studied Using a Novel Force Microscope....Pages 105-112
Imaging Local Electric Forces in Organic Thin Films by Scanning Maxwell Stress Microscopy....Pages 113-118
Simultaneous AFM and Local Conductivity Imaging....Pages 119-122
Micromechanical Heat Sensor: Observation of a Chemical Reaction, Photon and Electrical Heat Pulses....Pages 123-131
Forces in Scanning Probe Microscopy....Pages 133-147
Controlled Motion of Xe Atom on Metal Surfaces....Pages 149-155
Van Der Waals Forces and Probe Geometries for Some Specific Scanning Force Microscopy Studies....Pages 157-167
Atomistic Theory of the Interaction Between AFM Tips and Ionic Surfaces....Pages 169-174
Molecular Dynamics Simulation of Atomic-Scale Adhesion, Deformation, Friction, and Modification of Diamond Surfaces....Pages 175-181
Atomic-Scale Metal Adhesion....Pages 183-189
Photons and Forces I: Light Generates Force....Pages 191-234
Photons and Forces 11: Forces Influence Light....Pages 235-248
Interfacial Friction and Adhesion of Wetted Monolayers....Pages 249-262
Coherent Phonon Generation in the Process of Friction....Pages 263-271
Friction Force Microscopy....Pages 273-283
Molecular Scale Study of Domain Boundaries and Frictional Stick-Slip Motion on Lipid Bilayers....Pages 285-306
Two-Dimensional Atomic-Scale Friction Observed with an AFM....Pages 307-312
Normal and Lateral Forces in Friction Force Microscopy....Pages 313-318
Nanotribology and Chemical Sensitivity on a Nanometer Scale....Pages 319-324
Lateral Force Measurements on Phase Separated Polymer Surfaces....Pages 325-330
Friction and Load on Well Defined Surfaces Studied by Atomic Force Microscopy....Pages 331-336
Friction on an Atomic Scale....Pages 337-344
Nanomechanics: — Atomic Resolution and Frictional Energy Dissipation in Atomic Force Microscopy....Pages 345-352
Nanotribology and its Applications to Magnetic Storage Devices and MEMS....Pages 353-366
Lifeime Criteria of Macro- and Microtribological Systems....Pages 367-395
Mechanical Property Evaluations of Solid Surfaces as a Technological Application of SPM....Pages 397-404
Effects of Boundary Lubricants and Metallic Oxides in Steel-Steel Tribological Junctions Studied with the Atomic Force Microscope....Pages 405-424
High-Density Recording Technologies as an Application of SPM....Pages 425-430
Applications of Magnetic Force Microscopy....Pages 431-446
Magnetic Force Microscopy on Thin Film Magnetic Recording Media....Pages 447-470
Analysis of Vortices in Superconductors by Scanning Probe Microscopy....Pages 471-476
Understanding Surface Chemical Processes in Environmental Contamination: New Applications for AFM....Pages 477-482
Force Microscopy of Heavy Ion Irradiated Materials....Pages 483-488
Atomic Force Microscopy as a Tool to Study Surface Roughness Effects in X-Ray Photoelectron Spectroscopy....Pages 489-494
Time Dependence and its Spatial Distribution of Densely Contact-Electrified Electrons on a Thin Silicon Oxide....Pages 495-499
Atomic-Resolution Image of GaAs(110) Surface with an Ultrahigh-Vacuum Atomic Force Microscope (UHV-AFM)....Pages 501-506
Giant Atomic Corrugations on Layered Dichalcogenides Investigated by AFM/LFM....Pages 507-512
Nanometer Scale Machining of Covalent Monolayers Investigated by Combined AFM/LFM....Pages 513-518
Atomic Resolution Imaging of ReS2 by AFM/LFM....Pages 519-524
Ultra-High-Vacuum Atomic Force Microscopy in the Study of Model Catalysts....Pages 525-530
AFM Observations of Si(111) in Solutions....Pages 531-536
Atomic Scale Force Mapping with the Atomic Force Microscope....Pages 537-542
Imaging Chemical Bonds by SPM....Pages 543-549
Study of Thin Organic Films by Various Scanning Force Microscopes....Pages 551-566
Molecular Arrangement and Mechanical Stability of Self-Assembled Monolayers on Au(111) Under Applied Load....Pages 567-591
Organic Interface Inspection by Scanning Force Microscopy....Pages 593-598
Atomic Force Microscopy of Biological Membranes: Current Possibilities and Prospects....Pages 599-606
Biomolecule Photoimmobilization: Application in Scanning Probe Microscopy....Pages 607-614
Measuring Molecular Adhesion with Force Microscopy....Pages 615-623
Back Matter....Pages 625-631
....Pages 633-644