Ebook: Surface Analysis Methods in Materials Science

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Content:
Front Matter....Pages I-XXI
Front Matter....Pages 1-1
Solid Surfaces, Their Structure and Composition....Pages 3-65
UHV Basics....Pages 67-76
Front Matter....Pages 77-77
Electron Microscope Techniques for Surface Characterization....Pages 79-96
Sputter Depth Profiling....Pages 97-116
SIMS — Secondary Ion Mass Spectrometry....Pages 117-147
Auger Spectroscopy and Scanning Auger Microscopy....Pages 149-164
X-Ray Photoelectron Spectroscopy....Pages 165-186
Fourier Transform Infrared Spectroscopy of Surfaces....Pages 187-201
Rutherford Backscattering Spectrometry and Nuclear Reaction Analysis....Pages 203-219
Scanning Tunnelling Microscopy....Pages 221-244
Low Energy Ion Scattering....Pages 245-262
Reflection High Energy Electron Diffraction....Pages 263-274
Low Energy Electron Diffraction....Pages 275-289
Ultraviolet Photoelectron Spectroscopy of Solids....Pages 291-300
Spin Polarized Electron Techniques....Pages 301-316
Front Matter....Pages 317-317
Materials Technology....Pages 319-336
Characterization of Catalysts by Surface Analysis....Pages 337-351
Applications to Devices and Device Materials....Pages 353-370
Characterization of Oxidized Surfaces....Pages 371-386
Coated Steel....Pages 387-401
Front Matter....Pages 317-317
Thin Film Analysis....Pages 403-415
Identification of Adsorbed Species....Pages 417-429
Back Matter....Pages 431-453

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Content:
Front Matter....Pages I-XXI
Front Matter....Pages 1-1
Solid Surfaces, Their Structure and Composition....Pages 3-65
UHV Basics....Pages 67-76
Front Matter....Pages 77-77
Electron Microscope Techniques for Surface Characterization....Pages 79-96
Sputter Depth Profiling....Pages 97-116
SIMS — Secondary Ion Mass Spectrometry....Pages 117-147
Auger Spectroscopy and Scanning Auger Microscopy....Pages 149-164
X-Ray Photoelectron Spectroscopy....Pages 165-186
Fourier Transform Infrared Spectroscopy of Surfaces....Pages 187-201
Rutherford Backscattering Spectrometry and Nuclear Reaction Analysis....Pages 203-219
Scanning Tunnelling Microscopy....Pages 221-244
Low Energy Ion Scattering....Pages 245-262
Reflection High Energy Electron Diffraction....Pages 263-274
Low Energy Electron Diffraction....Pages 275-289
Ultraviolet Photoelectron Spectroscopy of Solids....Pages 291-300
Spin Polarized Electron Techniques....Pages 301-316
Front Matter....Pages 317-317
Materials Technology....Pages 319-336
Characterization of Catalysts by Surface Analysis....Pages 337-351
Applications to Devices and Device Materials....Pages 353-370
Characterization of Oxidized Surfaces....Pages 371-386
Coated Steel....Pages 387-401
Front Matter....Pages 317-317
Thin Film Analysis....Pages 403-415
Identification of Adsorbed Species....Pages 417-429
Back Matter....Pages 431-453
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