Ebook: Materials Research with Ion Beams
- Tags: Characterization and Evaluation of Materials, Solid State Physics, Spectroscopy and Microscopy, Industrial Chemistry/Chemical Engineering, Nuclear Physics Heavy Ions Hadrons, Nuclear Fusion
- Series: Research Reports in Physics
- Year: 1992
- Publisher: Springer-Verlag Berlin Heidelberg
- Edition: 1
- Language: English
- pdf
Due to new technological progress in the development of ion sources and accelerators interesting kinds of beams are now available. They open new fields for materials research with ion beams. The present status and future possibilities of these research activities are described by experts on this field in the form of review articles. The papers presented in the book focus on very different aspects ranging from the field of truly appliedresearch to the field of fundamental atomic research investigating interaction mechanisms of slow, highly charged particles with surfaces. The book is intended to provide a source of information about recent developments in basic research for the physicists about the status ofthe input of their work into applied materials science. In addition, also other well established techniques, such as Rutherford backscattering analysis and their use in materials research such as of HTC are described. The reader of this book will benefit from its broad view over the various methods of materilas research with ion beams.
Due to new technological progress in the development of ion sources and accelerators interesting kinds of beams are now available. They open new fields for materials research with ion beams. The present status and future possibilities of these research activities are described by experts on this field in the form of review articles. The papers presented in the book focus on very different aspects ranging from the field of truly appliedresearch to the field of fundamental atomic research investigating interaction mechanisms of slow, highly charged particles with surfaces. The book is intended to provide a source of information about recent developments in basic research for the physicists about the status ofthe input of their work into applied materials science. In addition, also other well established techniques, such as Rutherford backscattering analysis and their use in materials research such as of HTC are described. The reader of this book will benefit from its broad view over the various methods of materilas research with ion beams.
Due to new technological progress in the development of ion sources and accelerators interesting kinds of beams are now available. They open new fields for materials research with ion beams. The present status and future possibilities of these research activities are described by experts on this field in the form of review articles. The papers presented in the book focus on very different aspects ranging from the field of truly appliedresearch to the field of fundamental atomic research investigating interaction mechanisms of slow, highly charged particles with surfaces. The book is intended to provide a source of information about recent developments in basic research for the physicists about the status ofthe input of their work into applied materials science. In addition, also other well established techniques, such as Rutherford backscattering analysis and their use in materials research such as of HTC are described. The reader of this book will benefit from its broad view over the various methods of materilas research with ion beams.
Content:
Front Matter....Pages I-VII
Ion Tracks in Materials Research and Microtechnology....Pages 1-12
Rare Gases in Metals — Influence on the Formation and Nucleation of Cavities....Pages 13-24
Plasma-Wall Interaction in Controlled Thermonuclear Fusion Research....Pages 25-35
Novel Applications of Narrow Nuclear Resonances....Pages 36-43
Molecular Dynamics Simulation of Cluster-Ion Impacts....Pages 44-56
Channeling: A Marriage of Atomic Collision Physics and Materials Science....Pages 57-70
The Frankfurt ECR-RFQ Ion-Beam Facility for Slow Highly Charged Ions....Pages 71-83
Role of Ion Beams in Superconductor Research....Pages 84-104
Slow Particle-Induced Electron Emission from Above and Below Metal Surfaces....Pages 105-117
Electrons Captured and Emitted by Highly Charged Ions near Surfaces....Pages 118-127
Semiconductor Detectors for Nuclear Radiation — A Review....Pages 128-143
Back Matter....Pages 145-145
Due to new technological progress in the development of ion sources and accelerators interesting kinds of beams are now available. They open new fields for materials research with ion beams. The present status and future possibilities of these research activities are described by experts on this field in the form of review articles. The papers presented in the book focus on very different aspects ranging from the field of truly appliedresearch to the field of fundamental atomic research investigating interaction mechanisms of slow, highly charged particles with surfaces. The book is intended to provide a source of information about recent developments in basic research for the physicists about the status ofthe input of their work into applied materials science. In addition, also other well established techniques, such as Rutherford backscattering analysis and their use in materials research such as of HTC are described. The reader of this book will benefit from its broad view over the various methods of materilas research with ion beams.
Content:
Front Matter....Pages I-VII
Ion Tracks in Materials Research and Microtechnology....Pages 1-12
Rare Gases in Metals — Influence on the Formation and Nucleation of Cavities....Pages 13-24
Plasma-Wall Interaction in Controlled Thermonuclear Fusion Research....Pages 25-35
Novel Applications of Narrow Nuclear Resonances....Pages 36-43
Molecular Dynamics Simulation of Cluster-Ion Impacts....Pages 44-56
Channeling: A Marriage of Atomic Collision Physics and Materials Science....Pages 57-70
The Frankfurt ECR-RFQ Ion-Beam Facility for Slow Highly Charged Ions....Pages 71-83
Role of Ion Beams in Superconductor Research....Pages 84-104
Slow Particle-Induced Electron Emission from Above and Below Metal Surfaces....Pages 105-117
Electrons Captured and Emitted by Highly Charged Ions near Surfaces....Pages 118-127
Semiconductor Detectors for Nuclear Radiation — A Review....Pages 128-143
Back Matter....Pages 145-145
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