Ebook: Surface and Interface Characterization by Electron Optical Methods

The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident. To join the expertise of the tradi tional surface scientist with that of the electron microscopist has however been a slow and difficult process. In the past few years remarkable progress has been achieved, including the development of new techniques of scanning transmission and reflection imaging as well as low energy microscopy, all carried out in greatly improved vacuum conditions. Most astonishing of all has been the advent of the scanning tunneling electron microscope providing atomic resolution in a manner readily compatible with most surface science diagnostic procedures. The problem of beam damage, though often serious, is increasingly well understood so that we can assess the reliability and usefulness of the results which can now be obtained in catalysis studies and a wide range of surface science applications. These new developments and many others in more established surface techniques are all described in this book, based on lectures given at a NATO Advanced Study Institute held in Erice, Sicily, at Easter 1987. It is regretted that a few lectures on low energy electron diffraction and channeling effects could not be included. Fifteen lecturers from seven different Countries and 67 students from 23 Countries and a wide variety of backgrounds attended the school.

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Content:
Front Matter....Pages i-viii
Principles and Techniques of Transmission Imaging of Surfaces....Pages 1-9
Catalyst Studies by Scanning Transmission Electron Microscopy....Pages 11-18
Localised Surface Imaging and Spectroscopy in the Scanning Transmission Electron Microscope....Pages 19-29
Fundamentals of High Resolution Transmission Electron Microscopy....Pages 31-42
Profile Imaging of Small Particles, Extended Surfaces and Dynamic Surface Phenomena....Pages 43-54
Transmission Electron Microscopy and Diffraction from Semiconductor Interfaces and Surfaces....Pages 55-76
The Transmission Electron Microscopy of Interfaces and Multilayers....Pages 77-88
Surface Microanalysis and Microscopy by X-Ray Photoelectron Spectroscopy (XPS), Core-Loss Spectroscopy (CLS) and Auger Electron Spectroscopy (AES)....Pages 89-125
Reflection Electron Microscopy....Pages 127-158
An Introduction to Reflection High Energy Electron Diffraction....Pages 159-184
Intensity Oscillations in Reflection High Energy Electron Diffraction during Epitaxial Growth....Pages 185-193
Emission and Low Energy Reflection Electron Microscopy....Pages 195-233
Scanning Tunneling Microscopy and Spectroscopy....Pages 235-266
Spin-Polarized Secondary Electrons from Ferromagnets....Pages 267-283
Electronically Stimulated Desorption: Mechanisms, Applications, and Implications....Pages 285-299
Structure and Catalytic Activity of Surfaces....Pages 301-313
Back Matter....Pages 315-319

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Content:
Front Matter....Pages i-viii
Principles and Techniques of Transmission Imaging of Surfaces....Pages 1-9
Catalyst Studies by Scanning Transmission Electron Microscopy....Pages 11-18
Localised Surface Imaging and Spectroscopy in the Scanning Transmission Electron Microscope....Pages 19-29
Fundamentals of High Resolution Transmission Electron Microscopy....Pages 31-42
Profile Imaging of Small Particles, Extended Surfaces and Dynamic Surface Phenomena....Pages 43-54
Transmission Electron Microscopy and Diffraction from Semiconductor Interfaces and Surfaces....Pages 55-76
The Transmission Electron Microscopy of Interfaces and Multilayers....Pages 77-88
Surface Microanalysis and Microscopy by X-Ray Photoelectron Spectroscopy (XPS), Core-Loss Spectroscopy (CLS) and Auger Electron Spectroscopy (AES)....Pages 89-125
Reflection Electron Microscopy....Pages 127-158
An Introduction to Reflection High Energy Electron Diffraction....Pages 159-184
Intensity Oscillations in Reflection High Energy Electron Diffraction during Epitaxial Growth....Pages 185-193
Emission and Low Energy Reflection Electron Microscopy....Pages 195-233
Scanning Tunneling Microscopy and Spectroscopy....Pages 235-266
Spin-Polarized Secondary Electrons from Ferromagnets....Pages 267-283
Electronically Stimulated Desorption: Mechanisms, Applications, and Implications....Pages 285-299
Structure and Catalytic Activity of Surfaces....Pages 301-313
Back Matter....Pages 315-319
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