Ebook: Material Characterization Using Ion Beams
- Tags: Solid State Physics, Spectroscopy and Microscopy
- Series: NATO Advanced Study Institutes Series 28
- Year: 1978
- Publisher: Springer US
- Edition: 1
- Language: English
- pdf
The extensive use of low-energy accelerators in non-nuclear physics has now reached the stage where these activities are recognized as a natural field of investigation. Many other areas in physics and chemistry have undergone similarly spectacular development: beam foil spectroscopy in atomic physics, studies in atomic collisions, materials implantation, defects creation, nuclear microanalysis, and so on. Now, this most recent activity by itself and in its evident connec tion with the others has brought a new impetus to both the funda mental and the applied aspects of materials science. A summer school on "Material Characterization Using Ion Beams" has resulted from these developments and the realization that the use of ion beams is not restricted to accelerators but covers a wide energy range in the developing technology. The idea of the ion beam as a common denominator of many act1v1t1es dealing with surface and near-surface characterization was enthu siastically received by many scientists and a school on this subject received the positive endorsement of NATO. The Advanced Study Institute on Materials Science has assumed for us the status of an "institution" leading to better contact among the many laboratories engaged in this field. The fourth Institute in this series was held in Aleria, Corsica, between August 22 and September 12, 1976.
Content:
Front Matter....Pages i-xviii
Front Matter....Pages 1-1
Energy Loss of Charged Particles....Pages 3-34
Some General Considerations of Ion Beam Production and Manipulation....Pages 35-61
Front Matter....Pages 63-63
Applications of Low-Energy Ion Scattering....Pages 65-79
Ion Beam Induced Light Emission: Mechanisms and Analytical Applications....Pages 81-99
Complementary Analysis Techniques: AES, ESCA....Pages 101-140
Front Matter....Pages 141-141
Fundamental Aspects of Ion Microanalysis....Pages 143-238
Ion Induced X-rays: General Description....Pages 239-281
The Evolving Use of Electrons, Protons and Heavy Ions in the Characterisation of Materials....Pages 283-301
Backscattering of Ions with Intermediate Energies....Pages 303-332
Backscattering Analysis with MeV 4He Ions....Pages 333-366
Microanalysis by Direct Observation of Nuclear Reactions....Pages 367-402
Front Matter....Pages 403-403
Channeling: General Description....Pages 405-428
Flux Peaking — Lattice Location....Pages 429-453
Analysis of Defects by Channeling....Pages 455-481
Application of MeV Ion Channeling to Surface Studies....Pages 483-495
Front Matter....Pages 497-497
General Conclusions....Pages 499-504
Back Matter....Pages 505-517
Content:
Front Matter....Pages i-xviii
Front Matter....Pages 1-1
Energy Loss of Charged Particles....Pages 3-34
Some General Considerations of Ion Beam Production and Manipulation....Pages 35-61
Front Matter....Pages 63-63
Applications of Low-Energy Ion Scattering....Pages 65-79
Ion Beam Induced Light Emission: Mechanisms and Analytical Applications....Pages 81-99
Complementary Analysis Techniques: AES, ESCA....Pages 101-140
Front Matter....Pages 141-141
Fundamental Aspects of Ion Microanalysis....Pages 143-238
Ion Induced X-rays: General Description....Pages 239-281
The Evolving Use of Electrons, Protons and Heavy Ions in the Characterisation of Materials....Pages 283-301
Backscattering of Ions with Intermediate Energies....Pages 303-332
Backscattering Analysis with MeV 4He Ions....Pages 333-366
Microanalysis by Direct Observation of Nuclear Reactions....Pages 367-402
Front Matter....Pages 403-403
Channeling: General Description....Pages 405-428
Flux Peaking — Lattice Location....Pages 429-453
Analysis of Defects by Channeling....Pages 455-481
Application of MeV Ion Channeling to Surface Studies....Pages 483-495
Front Matter....Pages 497-497
General Conclusions....Pages 499-504
Back Matter....Pages 505-517
....