Ebook: Reliability Physics and Engineering: Time-To-Failure Modeling
Author: J. W. McPherson (auth.)
- Tags: Electronics and Microelectronics Instrumentation, Quality Control Reliability Safety and Risk, Statistical Theory and Methods, Energy general
- Year: 2013
- Publisher: Springer International Publishing
- Edition: 2
- Language: English
- pdf
"Reliability Physics and Engineering" provides critically important information for designing and building reliable cost-effective products. The textbook contains numerous example problems with solutions. Included at the end of each chapter are exercise problems and answers. "Reliability Physics and Engineering" is a useful resource for students, engineers, and materials scientists.
Reliability Physics and Engineering provides critically important information that is needed for designing and building reliable cost-effective products.
Key features include:
· Materials/Device Degradation
· Degradation Kinetics
· Time-To-Failure Modeling
· Statistical Tools
· Failure-Rate Modeling
· Accelerated Testing
· Ramp-To-Failure Testing
· Important Failure Mechanisms for Integrated Circuits
· Important Failure Mechanisms for Mechanical Components
· Conversion of Dynamic Stresses into Static Equivalents
· Small Design Changes Producing Major Reliability Improvements
· Screening Methods
· Heat Generation and Dissipation
· Sampling Plans and Confidence Intervals
This textbook includes numerous example problems with solutions. Also, exercise problems along with the answers are included at the end of each chapter.
Reliability Physics and Engineering can be a very useful resource for students, engineers, and materials scientists.
Reliability Physics and Engineering provides critically important information that is needed for designing and building reliable cost-effective products.
Key features include:
· Materials/Device Degradation
· Degradation Kinetics
· Time-To-Failure Modeling
· Statistical Tools
· Failure-Rate Modeling
· Accelerated Testing
· Ramp-To-Failure Testing
· Important Failure Mechanisms for Integrated Circuits
· Important Failure Mechanisms for Mechanical Components
· Conversion of Dynamic Stresses into Static Equivalents
· Small Design Changes Producing Major Reliability Improvements
· Screening Methods
· Heat Generation and Dissipation
· Sampling Plans and Confidence Intervals
This textbook includes numerous example problems with solutions. Also, exercise problems along with the answers are included at the end of each chapter.
Reliability Physics and Engineering can be a very useful resource for students, engineers, and materials scientists.
Content:
Front Matter....Pages i-xvi
Introduction....Pages 1-3
Materials and Device Degradation ....Pages 5-28
From Material/Device Degradation to Time-to-Failure....Pages 29-36
Time-to-Failure Modeling....Pages 37-49
Gaussian Statistics: An Overview....Pages 51-60
Time-to-Failure Statistics....Pages 61-74
Failure Rate Modeling....Pages 75-89
Accelerated Degradation ....Pages 91-103
Acceleration Factor Modeling....Pages 105-115
Ramp-to-Failure Testing....Pages 117-132
Time-to-Failure Models for Selected Failure Mechanisms in Integrated Circuits....Pages 133-192
Time-to-Failure Models for Selected Failure Mechanisms in Mechanical Engineering....Pages 193-266
Conversion of Dynamical Stresses into Effective Static Values....Pages 267-290
Increasing the Reliability of Device/Product Designs....Pages 291-302
Screening....Pages 303-317
Heat Generation and Dissipation....Pages 319-353
Sampling Plans and Confidence Intervals....Pages 355-376
Back Matter....Pages 377-399
Reliability Physics and Engineering provides critically important information that is needed for designing and building reliable cost-effective products.
Key features include:
· Materials/Device Degradation
· Degradation Kinetics
· Time-To-Failure Modeling
· Statistical Tools
· Failure-Rate Modeling
· Accelerated Testing
· Ramp-To-Failure Testing
· Important Failure Mechanisms for Integrated Circuits
· Important Failure Mechanisms for Mechanical Components
· Conversion of Dynamic Stresses into Static Equivalents
· Small Design Changes Producing Major Reliability Improvements
· Screening Methods
· Heat Generation and Dissipation
· Sampling Plans and Confidence Intervals
This textbook includes numerous example problems with solutions. Also, exercise problems along with the answers are included at the end of each chapter.
Reliability Physics and Engineering can be a very useful resource for students, engineers, and materials scientists.
Content:
Front Matter....Pages i-xvi
Introduction....Pages 1-3
Materials and Device Degradation ....Pages 5-28
From Material/Device Degradation to Time-to-Failure....Pages 29-36
Time-to-Failure Modeling....Pages 37-49
Gaussian Statistics: An Overview....Pages 51-60
Time-to-Failure Statistics....Pages 61-74
Failure Rate Modeling....Pages 75-89
Accelerated Degradation ....Pages 91-103
Acceleration Factor Modeling....Pages 105-115
Ramp-to-Failure Testing....Pages 117-132
Time-to-Failure Models for Selected Failure Mechanisms in Integrated Circuits....Pages 133-192
Time-to-Failure Models for Selected Failure Mechanisms in Mechanical Engineering....Pages 193-266
Conversion of Dynamical Stresses into Effective Static Values....Pages 267-290
Increasing the Reliability of Device/Product Designs....Pages 291-302
Screening....Pages 303-317
Heat Generation and Dissipation....Pages 319-353
Sampling Plans and Confidence Intervals....Pages 355-376
Back Matter....Pages 377-399
....