Ebook: Nyquist AD Converters, Sensor Interfaces, and Robustness: Advances in Analog Circuit Design, 2012
- Tags: Circuits and Systems, Electronics and Microelectronics Instrumentation
- Year: 2013
- Publisher: Springer-Verlag New York
- Edition: 1
- Language: English
- pdf
This book is based on the 18 presentations during the 21st workshop on Advances in Analog Circuit Design. Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity. This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development.
This book is based on the presentations during the 21st workshop on Advances in Analog Circuit Design. Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity. This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development.
- Provides a state-of-the-art reference in analog circuit design, written by experts from industry and academia;
- Presents material in a tutorial-based format;
- Includes coverage of Nyquist A/D converters, capacitive sensor interfaces, reliability, variability, and connectivity.
This book is based on the presentations during the 21st workshop on Advances in Analog Circuit Design. Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity. This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development.
- Provides a state-of-the-art reference in analog circuit design, written by experts from industry and academia;
- Presents material in a tutorial-based format;
- Includes coverage of Nyquist A/D converters, capacitive sensor interfaces, reliability, variability, and connectivity.
Content:
Front Matter....Pages i-x
Front Matter....Pages 1-2
High Performance Piplined A/D Converters in CMOS and BiCMOS Processes....Pages 3-12
A 12-bit 800 MS/s Dual-Residue Pipeline ADC....Pages 13-30
Time-Interleaved SAR and Slope Converters....Pages 31-49
GS/s AD Conversion for Broadband Multi-stream Reception....Pages 51-71
CMOS Ultra-High-Speed Time-Interleaved ADCs....Pages 73-96
CMOS ADCs for Optical Communications....Pages 97-114
Front Matter....Pages 115-115
Motion MEMS and Sensors, Today and Tomorrow....Pages 117-127
Energy-Efficient Capacitive Sensor Interfaces....Pages 129-147
Interface Circuits for MEMS Microphones....Pages 149-174
Front End Electronics for Solid State Detectors in Today and Future High Energy Physics Experiments....Pages 175-199
Front Matter....Pages 201-201
How Can Chips Live Under Radiation?....Pages 203-221
Radiation-Tolerant MASH Delta-Sigma Time-to-Digital Converters....Pages 223-243
A Designer’s View on Mismatch....Pages 245-267
Analog Circuit Design in Organic Thin-Film Transistor Technologies on Foil: An Overview....Pages 269-279
Impact of Statistical Variability on FinFET Technology: From Device, Statistical Compact Modelling to Statistical Circuit Simulation....Pages 281-291
This book is based on the presentations during the 21st workshop on Advances in Analog Circuit Design. Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity. This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development.
- Provides a state-of-the-art reference in analog circuit design, written by experts from industry and academia;
- Presents material in a tutorial-based format;
- Includes coverage of Nyquist A/D converters, capacitive sensor interfaces, reliability, variability, and connectivity.
Content:
Front Matter....Pages i-x
Front Matter....Pages 1-2
High Performance Piplined A/D Converters in CMOS and BiCMOS Processes....Pages 3-12
A 12-bit 800 MS/s Dual-Residue Pipeline ADC....Pages 13-30
Time-Interleaved SAR and Slope Converters....Pages 31-49
GS/s AD Conversion for Broadband Multi-stream Reception....Pages 51-71
CMOS Ultra-High-Speed Time-Interleaved ADCs....Pages 73-96
CMOS ADCs for Optical Communications....Pages 97-114
Front Matter....Pages 115-115
Motion MEMS and Sensors, Today and Tomorrow....Pages 117-127
Energy-Efficient Capacitive Sensor Interfaces....Pages 129-147
Interface Circuits for MEMS Microphones....Pages 149-174
Front End Electronics for Solid State Detectors in Today and Future High Energy Physics Experiments....Pages 175-199
Front Matter....Pages 201-201
How Can Chips Live Under Radiation?....Pages 203-221
Radiation-Tolerant MASH Delta-Sigma Time-to-Digital Converters....Pages 223-243
A Designer’s View on Mismatch....Pages 245-267
Analog Circuit Design in Organic Thin-Film Transistor Technologies on Foil: An Overview....Pages 269-279
Impact of Statistical Variability on FinFET Technology: From Device, Statistical Compact Modelling to Statistical Circuit Simulation....Pages 281-291
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