Ebook: Defect Oriented Testing for CMOS Analog and Digital Circuits

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Content:
Front Matter....Pages i-xiv
Introduction....Pages 1-14
Digital CMOS Fault Modeling and Inductive Fault Analysis....Pages 15-63
Defects in Logic Circuits and Their Test Implications....Pages 65-94
Testing Defects in Sequential Circuits....Pages 95-132
Defect Oriented RAM Testing and Current Testable RAMs....Pages 133-204
Testing Defects in Programmable Logic Circuits....Pages 205-241
Defect Oriented Analog Testing....Pages 243-296
Conclusion....Pages 297-303
Back Matter....Pages 305-308

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Content:
Front Matter....Pages i-xiv
Introduction....Pages 1-14
Digital CMOS Fault Modeling and Inductive Fault Analysis....Pages 15-63
Defects in Logic Circuits and Their Test Implications....Pages 65-94
Testing Defects in Sequential Circuits....Pages 95-132
Defect Oriented RAM Testing and Current Testable RAMs....Pages 133-204
Testing Defects in Programmable Logic Circuits....Pages 205-241
Defect Oriented Analog Testing....Pages 243-296
Conclusion....Pages 297-303
Back Matter....Pages 305-308
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