Ebook: Atom Probe Microscopy

Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.

Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.

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Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.

Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.

• Provides the most practical, up-to-date and critical review of atom probe microscopy techniques
• Presents a detailed description of the analysis tools
• Includes practical examples of how the technique can be used in materials science research
• Stands as a must-have reference for any user of atom probe microscopy

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Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.

Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.

• Provides the most practical, up-to-date and critical review of atom probe microscopy techniques
• Presents a detailed description of the analysis tools
• Includes practical examples of how the technique can be used in materials science research
• Stands as a must-have reference for any user of atom probe microscopy

Content:
Front Matter....Pages i-xxiii
Front Matter....Pages 1-1
Introduction....Pages 3-7
Field Ion Microscopy....Pages 9-28
From Field Desorption Microscopy to Atom Probe Tomography....Pages 29-68
Front Matter....Pages 69-69
Specimen Preparation....Pages 71-110
Experimental Protocols in Field Ion Microscopy....Pages 111-120
Experimental Protocols in Atom Probe Tomography....Pages 121-155
Tomographic Reconstruction....Pages 157-209
Front Matter....Pages 211-211
Analysis Techniques for Atom Probe Tomography....Pages 213-297
Atom Probe Microscopy and Materials Science....Pages 299-311
Appendices....Pages 313-385
Back Matter....Pages 387-396

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Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.

Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.

• Provides the most practical, up-to-date and critical review of atom probe microscopy techniques
• Presents a detailed description of the analysis tools
• Includes practical examples of how the technique can be used in materials science research
• Stands as a must-have reference for any user of atom probe microscopy

Content:
Front Matter....Pages i-xxiii
Front Matter....Pages 1-1
Introduction....Pages 3-7
Field Ion Microscopy....Pages 9-28
From Field Desorption Microscopy to Atom Probe Tomography....Pages 29-68
Front Matter....Pages 69-69
Specimen Preparation....Pages 71-110
Experimental Protocols in Field Ion Microscopy....Pages 111-120
Experimental Protocols in Atom Probe Tomography....Pages 121-155
Tomographic Reconstruction....Pages 157-209
Front Matter....Pages 211-211
Analysis Techniques for Atom Probe Tomography....Pages 213-297
Atom Probe Microscopy and Materials Science....Pages 299-311
Appendices....Pages 313-385
Back Matter....Pages 387-396
....