Ebook: Applied Scanning Probe Methods XII: Characterization
- Tags: Nanotechnology, Surfaces and Interfaces Thin Films, Polymer Sciences, Physical Chemistry, Solid State Physics, Spectroscopy and Microscopy
- Series: NanoScience and Technology
- Year: 2009
- Publisher: Springer-Verlag Berlin Heidelberg
- Edition: 1
- Language: English
- pdf
Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have to be coated with a metal layer due to their commonly non-conductive nature. Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties. Furthermore, for all kinds of materials a considerable amount of expe- mental effort is necessary to build a tensile testing machine that ts into the chamber. Therefore, a very promising alternative to SEM is based on the use of an atomic force microscope (AFM) to observe in situ surface deformation processes during straining of a specimen. First steps towards this goal were shown in the 1990s in [1–4] but none of these approaches truly was a microtensile test with sample thicknesses in the range of micrometers. To the authors’ knowledge, this was shown for the rst time by Hild et al. in [5]. 16.
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.
After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.
The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.
After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.
The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Content:
Front Matter....Pages I-LV
Direct Force Measurements of Receptor–Ligand Interactions on Living Cells....Pages 1-31
Imaging Chemical Groups and Molecular Recognition Sites on Live Cells Using AFM....Pages 33-48
Applications of Scanning Near-Field Optical Microscopy in Life Science....Pages 49-68
Adhesion and Friction Properties of Polymers at Nanoscale: Investigation by AFM....Pages 69-84
Mechanical Characterization of Materials by Micro-Indentation and AFM Scanning....Pages 85-120
Mechanical Properties of Metallic Nanocontacts....Pages 121-147
Dynamic AFM in Liquids: Viscous Damping and Applications to the Study of Confined Liquids....Pages 149-164
Microtensile Tests Using In Situ Atomic Force Microscopy....Pages 165-182
Scanning Tunneling Microscopy of the Si(111)-7?7 Surface and Adsorbed Ge Nanostructures....Pages 183-220
Back Matter....Pages 221-224
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.
After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.
The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Content:
Front Matter....Pages I-LV
Direct Force Measurements of Receptor–Ligand Interactions on Living Cells....Pages 1-31
Imaging Chemical Groups and Molecular Recognition Sites on Live Cells Using AFM....Pages 33-48
Applications of Scanning Near-Field Optical Microscopy in Life Science....Pages 49-68
Adhesion and Friction Properties of Polymers at Nanoscale: Investigation by AFM....Pages 69-84
Mechanical Characterization of Materials by Micro-Indentation and AFM Scanning....Pages 85-120
Mechanical Properties of Metallic Nanocontacts....Pages 121-147
Dynamic AFM in Liquids: Viscous Damping and Applications to the Study of Confined Liquids....Pages 149-164
Microtensile Tests Using In Situ Atomic Force Microscopy....Pages 165-182
Scanning Tunneling Microscopy of the Si(111)-7?7 Surface and Adsorbed Ge Nanostructures....Pages 183-220
Back Matter....Pages 221-224
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