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The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.




The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every 12 to 18 months to capture latest developments.

Volume VI presents 10 chapters on a variety of new and emerging techniques and refinements of SPM applications. A partial listing of topics covered includes:

-Scanning Tunneling Microscopy of Physisorbed Monolayers: From Self-Assembly to Molecular Devices

-Tunneling Electron Spectroscopy Towards Chemical Analysis of Single Molecules

-STM Studies on Molecular Assembly at Solid/Liquid Interfaces

-Single-Molecule Studies on Cells and Membranes Using the Atomic Force Microscope

-Atomic Force Microscopy of DNA Structure and Interactions

This series of books constitutes a timely and comprehensive overview of SPM applications. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.




The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every 12 to 18 months to capture latest developments.

Volume VI presents 10 chapters on a variety of new and emerging techniques and refinements of SPM applications. A partial listing of topics covered includes:

-Scanning Tunneling Microscopy of Physisorbed Monolayers: From Self-Assembly to Molecular Devices

-Tunneling Electron Spectroscopy Towards Chemical Analysis of Single Molecules

-STM Studies on Molecular Assembly at Solid/Liquid Interfaces

-Single-Molecule Studies on Cells and Membranes Using the Atomic Force Microscope

-Atomic Force Microscopy of DNA Structure and Interactions

This series of books constitutes a timely and comprehensive overview of SPM applications. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.


Content:
Front Matter....Pages I-XLV
Scanning Tunneling Microscopy of Physisorbed Monolayers: From Self-Assembly to Molecular Devices....Pages 1-30
Tunneling Electron Spectroscopy Towards Chemical Analysis of Single Molecules....Pages 31-63
STM Studies on Molecular Assembly at Solid/Liquid Interfaces....Pages 65-100
Single-Molecule Studies on Cells and Membranes Using the Atomic Force Microscope....Pages 101-125
Atomic Force Microscopy of DNA Structure and Interactions....Pages 127-164
Direct Detection of Ligand-Protein Interaction Using AFM....Pages 165-203
Dynamic Force Microscopy for Molecular-Scale Investigations of Organic Materials in Various Environments....Pages 205-245
Noncontact Atomic Force Microscopy....Pages 247-255
Tip-Enhanced Spectroscopy for Nano Investigation of Molecular Vibrations....Pages 257-285
Investigating Individual Carbon Nanotube/Polymer Interfaces with Scanning Probe Microscopy....Pages 287-323
Back Matter....Pages 325-338


The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every 12 to 18 months to capture latest developments.

Volume VI presents 10 chapters on a variety of new and emerging techniques and refinements of SPM applications. A partial listing of topics covered includes:

-Scanning Tunneling Microscopy of Physisorbed Monolayers: From Self-Assembly to Molecular Devices

-Tunneling Electron Spectroscopy Towards Chemical Analysis of Single Molecules

-STM Studies on Molecular Assembly at Solid/Liquid Interfaces

-Single-Molecule Studies on Cells and Membranes Using the Atomic Force Microscope

-Atomic Force Microscopy of DNA Structure and Interactions

This series of books constitutes a timely and comprehensive overview of SPM applications. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.


Content:
Front Matter....Pages I-XLV
Scanning Tunneling Microscopy of Physisorbed Monolayers: From Self-Assembly to Molecular Devices....Pages 1-30
Tunneling Electron Spectroscopy Towards Chemical Analysis of Single Molecules....Pages 31-63
STM Studies on Molecular Assembly at Solid/Liquid Interfaces....Pages 65-100
Single-Molecule Studies on Cells and Membranes Using the Atomic Force Microscope....Pages 101-125
Atomic Force Microscopy of DNA Structure and Interactions....Pages 127-164
Direct Detection of Ligand-Protein Interaction Using AFM....Pages 165-203
Dynamic Force Microscopy for Molecular-Scale Investigations of Organic Materials in Various Environments....Pages 205-245
Noncontact Atomic Force Microscopy....Pages 247-255
Tip-Enhanced Spectroscopy for Nano Investigation of Molecular Vibrations....Pages 257-285
Investigating Individual Carbon Nanotube/Polymer Interfaces with Scanning Probe Microscopy....Pages 287-323
Back Matter....Pages 325-338
....
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