Ebook: Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques

The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.

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The volumes V, VI and VII will examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in early 2006. The field is progressing so fast that there is a need for practically one volume every 12 to 18 months to capture latest developments.

These volumes constitute a timely comprehensive overview of SPM applications. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented.

The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

This book will benefit professionals in industry dealing with surface analytics and scientists at universities in physical chemistry/physics, materials science and polymer science departments.

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The volumes V, VI and VII will examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in early 2006. The field is progressing so fast that there is a need for practically one volume every 12 to 18 months to capture latest developments.

These volumes constitute a timely comprehensive overview of SPM applications. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented.

The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

This book will benefit professionals in industry dealing with surface analytics and scientists at universities in physical chemistry/physics, materials science and polymer science departments.

Content:
Front Matter....Pages I-XLV
Integrated Cantilevers and Atomic Force Microscopes....Pages 1-22
Electrostatic Microscanner....Pages 23-49
Low-Noise Methods for Optical Measurements of Cantilever Deflections....Pages 51-74
Q-controlled Dynamic Force Microscopy in Air and Liquids....Pages 75-97
High-Frequency Dynamic Force Microscopy....Pages 99-112
Torsional Resonance Microscopy and Its Applications....Pages 113-148
Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy....Pages 149-223
Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale....Pages 225-267
New AFM Developments to Study Elasticity and Adhesion at the Nanoscale....Pages 269-286
Near-Field Raman Spectroscopy and Imaging....Pages 287-329
Back Matter....Pages 331-344

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The volumes V, VI and VII will examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in early 2006. The field is progressing so fast that there is a need for practically one volume every 12 to 18 months to capture latest developments.

These volumes constitute a timely comprehensive overview of SPM applications. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented.

The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

This book will benefit professionals in industry dealing with surface analytics and scientists at universities in physical chemistry/physics, materials science and polymer science departments.

Content:
Front Matter....Pages I-XLV
Integrated Cantilevers and Atomic Force Microscopes....Pages 1-22
Electrostatic Microscanner....Pages 23-49
Low-Noise Methods for Optical Measurements of Cantilever Deflections....Pages 51-74
Q-controlled Dynamic Force Microscopy in Air and Liquids....Pages 75-97
High-Frequency Dynamic Force Microscopy....Pages 99-112
Torsional Resonance Microscopy and Its Applications....Pages 113-148
Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy....Pages 149-223
Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale....Pages 225-267
New AFM Developments to Study Elasticity and Adhesion at the Nanoscale....Pages 269-286
Near-Field Raman Spectroscopy and Imaging....Pages 287-329
Back Matter....Pages 331-344
....