Ebook: Applied Scanning Probe Methods IV: Industrial Applications
- Tags: Nanotechnology, Surfaces and Interfaces Thin Films, Polymer Sciences, Physical Chemistry, Solid State Physics and Spectroscopy, Analytical Chemistry
- Series: NanoScience and Technology
- Year: 2006
- Publisher: Springer-Verlag Berlin Heidelberg
- Edition: 1
- Language: English
- pdf
From the reviews:
"The editors have done a good job in making the various chapters quite readable and most of the chapters are well written on a level that will be accessible to most readers. … As is usually the case with Springer books, these volumes have been beautifully printed, illustrated, and nicely bound for long term durability." (Gary J. Long & Fernande Grandjean, Physicalia Magazine, Vol. 29 (4), 2007)
Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.
Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.
Content:
Front Matter....Pages I-XLIV
Scanning Probe Lithography for Chemical, Biological and Engineering Applications....Pages 1-33
Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM)....Pages 35-103
Nanofabrication with Self-Assembled Monolayers by Scanning Probe Lithography....Pages 105-135
Fabrication of Nanometer-Scale Structures by Local Oxidation Nanolithography....Pages 137-158
Template Effects of Molecular Assemblies Studied by Scanning Tunneling Microscopy (STM)....Pages 159-181
Microfabricated Cantilever Array Sensors for (Bio-)Chemical Detection....Pages 183-213
Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices....Pages 215-249
Applications of Heated Atomic Force Microscope Cantilevers....Pages 251-275
Back Matter....Pages 277-284
Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.
Content:
Front Matter....Pages I-XLIV
Scanning Probe Lithography for Chemical, Biological and Engineering Applications....Pages 1-33
Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM)....Pages 35-103
Nanofabrication with Self-Assembled Monolayers by Scanning Probe Lithography....Pages 105-135
Fabrication of Nanometer-Scale Structures by Local Oxidation Nanolithography....Pages 137-158
Template Effects of Molecular Assemblies Studied by Scanning Tunneling Microscopy (STM)....Pages 159-181
Microfabricated Cantilever Array Sensors for (Bio-)Chemical Detection....Pages 183-213
Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices....Pages 215-249
Applications of Heated Atomic Force Microscope Cantilevers....Pages 251-275
Back Matter....Pages 277-284
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