Ebook: Impact of Electron and Scanning Probe Microscopy on Materials Research

The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.

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This book presents a coherent synopsis of a rapidly evolving field. Subjects covered include diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. Specialised electron diffraction techniques are also covered, as is the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis. Materials analyzed include thin films, interfaces and non-conventional materials. WDS and EDS are treated, with an emphasis on phi(rhoZeta) techniques for the analysis of thin layers and surface films. Theoretical and practical aspects of ESEM are discussed in relation to applications in crystal growth, biomaterials and polymers. Recent developments in SPM are also described.
A comprehensive survey of the state of the art in electron and SPM, future research directions and prospective applications in materials engineering.

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This book presents a coherent synopsis of a rapidly evolving field. Subjects covered include diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. Specialised electron diffraction techniques are also covered, as is the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis. Materials analyzed include thin films, interfaces and non-conventional materials. WDS and EDS are treated, with an emphasis on phi(rhoZeta) techniques for the analysis of thin layers and surface films. Theoretical and practical aspects of ESEM are discussed in relation to applications in crystal growth, biomaterials and polymers. Recent developments in SPM are also described.
A comprehensive survey of the state of the art in electron and SPM, future research directions and prospective applications in materials engineering.
Content:
Front Matter....Pages i-xxiv
The Impact of Electron Microscopy on Materials Research....Pages 1-24
Microstructural Design and Tailoring of Advanced Materials....Pages 25-40
Nanostructured Materials....Pages 41-61
Characterization of Heterophase Transformation Interfaces by High-Resolution Transmission Electron Microscope Techniques....Pages 63-108
High Resolution Scanning Electron Microscopy Observations of Nano-Ceramics....Pages 109-134
Metal-Ceramic Interfaces Studied with High Resolution Transmission Electron Microscopy....Pages 135-159
Z-Contrast Scanning Transmission Electron Microscopy....Pages 161-207
Electron Energy Loss Spectrometry in the Electron Microscope....Pages 209-230
Electron Energy Loss Spectrometry in the Electron Microscope....Pages 231-249
Electron Energy Loss Spectrometry in the Electron Microscope....Pages 251-263
Eels Near Edge Structures....Pages 265-300
Surface Chemistry and Microstructure Analysis of Novel Technological Materials....Pages 301-323
Convergent Beam Electron Diffraction....Pages 325-337
New Developments in Scanning Probe Microscopy....Pages 339-357
Low-Energy Scanning Electron Microscope for Nanolithography....Pages 359-366
Application of Low Voltage Scanning Electron Microscopy and Energy Dispersive X-Ray Spectroscopy....Pages 367-385
Environmental SEM and Related Applications....Pages 387-396
Environmental SEM and Related Applications....Pages 397-406
Environmental SEM and Related Applications....Pages 407-413
ESEM Image Contrast and Applications to Wet Organic Materials....Pages 415-444
Advanced Electron and Scanning Probe Microscopy on Dental and Medical Materials Research....Pages 445-454
Correlative Microscopy and Probing in Materials Science....Pages 455-472
Back Matter....Pages 473-489

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This book presents a coherent synopsis of a rapidly evolving field. Subjects covered include diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. Specialised electron diffraction techniques are also covered, as is the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis. Materials analyzed include thin films, interfaces and non-conventional materials. WDS and EDS are treated, with an emphasis on phi(rhoZeta) techniques for the analysis of thin layers and surface films. Theoretical and practical aspects of ESEM are discussed in relation to applications in crystal growth, biomaterials and polymers. Recent developments in SPM are also described.
A comprehensive survey of the state of the art in electron and SPM, future research directions and prospective applications in materials engineering.
Content:
Front Matter....Pages i-xxiv
The Impact of Electron Microscopy on Materials Research....Pages 1-24
Microstructural Design and Tailoring of Advanced Materials....Pages 25-40
Nanostructured Materials....Pages 41-61
Characterization of Heterophase Transformation Interfaces by High-Resolution Transmission Electron Microscope Techniques....Pages 63-108
High Resolution Scanning Electron Microscopy Observations of Nano-Ceramics....Pages 109-134
Metal-Ceramic Interfaces Studied with High Resolution Transmission Electron Microscopy....Pages 135-159
Z-Contrast Scanning Transmission Electron Microscopy....Pages 161-207
Electron Energy Loss Spectrometry in the Electron Microscope....Pages 209-230
Electron Energy Loss Spectrometry in the Electron Microscope....Pages 231-249
Electron Energy Loss Spectrometry in the Electron Microscope....Pages 251-263
Eels Near Edge Structures....Pages 265-300
Surface Chemistry and Microstructure Analysis of Novel Technological Materials....Pages 301-323
Convergent Beam Electron Diffraction....Pages 325-337
New Developments in Scanning Probe Microscopy....Pages 339-357
Low-Energy Scanning Electron Microscope for Nanolithography....Pages 359-366
Application of Low Voltage Scanning Electron Microscopy and Energy Dispersive X-Ray Spectroscopy....Pages 367-385
Environmental SEM and Related Applications....Pages 387-396
Environmental SEM and Related Applications....Pages 397-406
Environmental SEM and Related Applications....Pages 407-413
ESEM Image Contrast and Applications to Wet Organic Materials....Pages 415-444
Advanced Electron and Scanning Probe Microscopy on Dental and Medical Materials Research....Pages 445-454
Correlative Microscopy and Probing in Materials Science....Pages 455-472
Back Matter....Pages 473-489
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