Ebook: Atomic Scale Interconnection Machines: Proceedings of the 1st AtMol European Workshop Singapore 28th-29th June 2011

This volume documents the first International Workshop on Atomic Scale Interconnection Machines organised by the European Integrated Project AtMol in June 2011 in Singapore. The four sessions, discussed here in revised contributions by high level speakers, span the subjects of multi-probe UHV instrumentation, atomic scale nano-material nanowires characterization, atomic scale surface conductance measurements, surface atomic scale mechanical machineries. This state-of-the-art account brings academic researchers and industry engineers access to the tools they need to be at the forefront of the atomic scale technology revolution.

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This volume documents the first International Workshop on Atomic Scale Interconnection Machines organised by the European Integrated Project AtMol in June 2011 in Singapore. The four sessions, discussed here in revised contributions by high level speakers, span topics such as: multi-probe UHV instrumentation, atomic scale nano-material nanowires characterization, atomic scale surface conductance measurements and surface atomic scale mechanical machineries. This state-of-the-art account allows academic researchers and industry engineers access to the tools they need to be at the forefront of the atomic scale technology revolution.

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This volume documents the first International Workshop on Atomic Scale Interconnection Machines organised by the European Integrated Project AtMol in June 2011 in Singapore. The four sessions, discussed here in revised contributions by high level speakers, span topics such as: multi-probe UHV instrumentation, atomic scale nano-material nanowires characterization, atomic scale surface conductance measurements and surface atomic scale mechanical machineries. This state-of-the-art account allows academic researchers and industry engineers access to the tools they need to be at the forefront of the atomic scale technology revolution.
Content:
Front Matter....Pages i-ix
High Precision Local Electrical Probing: Potential and Limitations for the Analysis of Nanocontacts and Nanointerconnects....Pages 1-8
Ultra-Compact Multitip Scanning Probe Microscope with an Outer Diameter of 50 mm....Pages 9-21
Atomic Scale Interconnection Machine....Pages 23-33
The DUF Project: A UHV Factory for Multi-Interconnection of a Molecule Logic Gates on Insulating Substrate....Pages 35-52
Challenges and Advances in Instrumentation of UHV LT Multi-Probe SPM System....Pages 53-79
On the Road to Multi-Probe Non-Contact AFM....Pages 81-87
Atomically Precise Manufacturing: The Opportunity, Challenges, and Impact....Pages 89-106
Combined STM and Four-Probe Resistivity Measurements on Single Semiconductor Nanowires....Pages 107-118
Probing Electronic Transport of Individual Nanostructures with Atomic Precision....Pages 119-130
Surface Conductance Measurements on a MoS2 Surface Using a UHV-Nanoprobe System....Pages 131-140
Multi-Probe Characterization of 1D and 2D Nanostructures Assembled on Ge(001) Surface by Gold Atom Deposition and Annealing....Pages 141-152
Nanometer-Scale Four-Point Probe Resistance Measurements of Individual Nanowires by Four-Tip STM....Pages 153-165
Silicon Surface Conductance Investigated Using a Multiple-Probe Scanning Tunneling Microscope....Pages 167-179
Atomic-Scale Devices in Silicon by Scanning Tunneling Microscopy....Pages 181-196
Electronic Transport on the Nanoscale....Pages 197-214
Solid State Nano Gears Manipulations....Pages 215-223
Probing Single Molecular Motors on Solid Surface....Pages 225-244

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This volume documents the first International Workshop on Atomic Scale Interconnection Machines organised by the European Integrated Project AtMol in June 2011 in Singapore. The four sessions, discussed here in revised contributions by high level speakers, span topics such as: multi-probe UHV instrumentation, atomic scale nano-material nanowires characterization, atomic scale surface conductance measurements and surface atomic scale mechanical machineries. This state-of-the-art account allows academic researchers and industry engineers access to the tools they need to be at the forefront of the atomic scale technology revolution.
Content:
Front Matter....Pages i-ix
High Precision Local Electrical Probing: Potential and Limitations for the Analysis of Nanocontacts and Nanointerconnects....Pages 1-8
Ultra-Compact Multitip Scanning Probe Microscope with an Outer Diameter of 50 mm....Pages 9-21
Atomic Scale Interconnection Machine....Pages 23-33
The DUF Project: A UHV Factory for Multi-Interconnection of a Molecule Logic Gates on Insulating Substrate....Pages 35-52
Challenges and Advances in Instrumentation of UHV LT Multi-Probe SPM System....Pages 53-79
On the Road to Multi-Probe Non-Contact AFM....Pages 81-87
Atomically Precise Manufacturing: The Opportunity, Challenges, and Impact....Pages 89-106
Combined STM and Four-Probe Resistivity Measurements on Single Semiconductor Nanowires....Pages 107-118
Probing Electronic Transport of Individual Nanostructures with Atomic Precision....Pages 119-130
Surface Conductance Measurements on a MoS2 Surface Using a UHV-Nanoprobe System....Pages 131-140
Multi-Probe Characterization of 1D and 2D Nanostructures Assembled on Ge(001) Surface by Gold Atom Deposition and Annealing....Pages 141-152
Nanometer-Scale Four-Point Probe Resistance Measurements of Individual Nanowires by Four-Tip STM....Pages 153-165
Silicon Surface Conductance Investigated Using a Multiple-Probe Scanning Tunneling Microscope....Pages 167-179
Atomic-Scale Devices in Silicon by Scanning Tunneling Microscopy....Pages 181-196
Electronic Transport on the Nanoscale....Pages 197-214
Solid State Nano Gears Manipulations....Pages 215-223
Probing Single Molecular Motors on Solid Surface....Pages 225-244
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