Ebook: Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
- Tags: Circuits and Systems, Computer-Aided Engineering (CAD CAE) and Design
- Year: 2010
- Publisher: Springer US
- Edition: 1
- Language: English
- pdf
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
by:
Alberto Bosio
Luigi Dilillo
Patrick Girard
Serge Pravossoudovitch
Arnaud Virazel
Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and diagnosis. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnosis of the latest generation of SRAM, one of the most widely used type of memories. Classical methods for testing memory are designed to handle the so-called "static faults", but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new faults, referred to as "dynamic faults", are not covered by classical algorithms and require the dedicated test and diagnosis solutions presented in this book.
- First book to present complete, state-of-the-art coverage of dynamic fault testing for SRAM memories;
- Presents content using a "bottom-up" approach, from the study of the electrical causes of malfunctions up to the generation of smart test strategies;
- Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.);
- Proposes an exhaustive analysis of resistive-open defects in each memory component and the resulting dynamic fault modeling.
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
by:
Alberto Bosio
Luigi Dilillo
Patrick Girard
Serge Pravossoudovitch
Arnaud Virazel
Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and diagnosis. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnosis of the latest generation of SRAM, one of the most widely used type of memories. Classical methods for testing memory are designed to handle the so-called "static faults", but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new faults, referred to as "dynamic faults", are not covered by classical algorithms and require the dedicated test and diagnosis solutions presented in this book.
- First book to present complete, state-of-the-art coverage of dynamic fault testing for SRAM memories;
- Presents content using a "bottom-up" approach, from the study of the electrical causes of malfunctions up to the generation of smart test strategies;
- Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.);
- Proposes an exhaustive analysis of resistive-open defects in each memory component and the resulting dynamic fault modeling.
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
by:
Alberto Bosio
Luigi Dilillo
Patrick Girard
Serge Pravossoudovitch
Arnaud Virazel
Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and diagnosis. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnosis of the latest generation of SRAM, one of the most widely used type of memories. Classical methods for testing memory are designed to handle the so-called "static faults", but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new faults, referred to as "dynamic faults", are not covered by classical algorithms and require the dedicated test and diagnosis solutions presented in this book.
- First book to present complete, state-of-the-art coverage of dynamic fault testing for SRAM memories;
- Presents content using a "bottom-up" approach, from the study of the electrical causes of malfunctions up to the generation of smart test strategies;
- Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.);
- Proposes an exhaustive analysis of resistive-open defects in each memory component and the resulting dynamic fault modeling.
Content:
Front Matter....Pages i-xv
Basics on SRAM Testing....Pages 1-19
Resistive-Open Defects in Core-Cells....Pages 21-48
Resistive-Open Defects in Pre-charge Circuits....Pages 49-64
Resistive-Open Defects in Address Decoders....Pages 65-80
Resistive-Open Defects in Write Drivers....Pages 81-97
Resistive-Open Defects in Sense Amplifiers....Pages 99-114
Faults Due to Process Variations in SRAMs....Pages 115-132
Diagnosis and Design-for-Diagnosis....Pages 133-158
Back Matter....Pages 159-171
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
by:
Alberto Bosio
Luigi Dilillo
Patrick Girard
Serge Pravossoudovitch
Arnaud Virazel
Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and diagnosis. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnosis of the latest generation of SRAM, one of the most widely used type of memories. Classical methods for testing memory are designed to handle the so-called "static faults", but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new faults, referred to as "dynamic faults", are not covered by classical algorithms and require the dedicated test and diagnosis solutions presented in this book.
- First book to present complete, state-of-the-art coverage of dynamic fault testing for SRAM memories;
- Presents content using a "bottom-up" approach, from the study of the electrical causes of malfunctions up to the generation of smart test strategies;
- Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.);
- Proposes an exhaustive analysis of resistive-open defects in each memory component and the resulting dynamic fault modeling.
Content:
Front Matter....Pages i-xv
Basics on SRAM Testing....Pages 1-19
Resistive-Open Defects in Core-Cells....Pages 21-48
Resistive-Open Defects in Pre-charge Circuits....Pages 49-64
Resistive-Open Defects in Address Decoders....Pages 65-80
Resistive-Open Defects in Write Drivers....Pages 81-97
Resistive-Open Defects in Sense Amplifiers....Pages 99-114
Faults Due to Process Variations in SRAMs....Pages 115-132
Diagnosis and Design-for-Diagnosis....Pages 133-158
Back Matter....Pages 159-171
....