Ebook: Noncontact Atomic Force Microscopy: Volume 2

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

---

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

---

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

Content:
Front Matter....Pages 1-17
Introduction....Pages 1-13
Method for Precise Force Measurements....Pages 15-30
Force Spectroscopy on Semiconductor Surfaces....Pages 31-68
Tip–Sample Interactions as a Function of Distance on Insulating Surfaces....Pages 69-94
Force Field Spectroscopy in Three Dimensions....Pages 95-119
Principles and Applications of the qPlus Sensor....Pages 121-142
Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond....Pages 143-167
Atom Manipulation on Semiconductor Surfaces....Pages 169-190
Atomic Manipulation on Metal Surfaces....Pages 191-215
Atomic Manipulation on an Insulator Surface....Pages 217-226
Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM....Pages 227-249
Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces....Pages 251-273
Magnetic Exchange Force Microscopy....Pages 275-286
First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001)....Pages 287-301
Frequency Modulation Atomic Force Microscopy in Liquids....Pages 303-328
Biological Applications of FM-AFM in Liquid Environment....Pages 329-345
High-Frequency Low Amplitude Atomic Force Microscopy....Pages 347-360
Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy....Pages 361-395
Back Matter....Pages 1-5

---

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

Content:
Front Matter....Pages 1-17
Introduction....Pages 1-13
Method for Precise Force Measurements....Pages 15-30
Force Spectroscopy on Semiconductor Surfaces....Pages 31-68
Tip–Sample Interactions as a Function of Distance on Insulating Surfaces....Pages 69-94
Force Field Spectroscopy in Three Dimensions....Pages 95-119
Principles and Applications of the qPlus Sensor....Pages 121-142
Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond....Pages 143-167
Atom Manipulation on Semiconductor Surfaces....Pages 169-190
Atomic Manipulation on Metal Surfaces....Pages 191-215
Atomic Manipulation on an Insulator Surface....Pages 217-226
Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM....Pages 227-249
Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces....Pages 251-273
Magnetic Exchange Force Microscopy....Pages 275-286
First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001)....Pages 287-301
Frequency Modulation Atomic Force Microscopy in Liquids....Pages 303-328
Biological Applications of FM-AFM in Liquid Environment....Pages 329-345
High-Frequency Low Amplitude Atomic Force Microscopy....Pages 347-360
Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy....Pages 361-395
Back Matter....Pages 1-5
....