Ebook: Design for Manufacturability and Statistical Design: A Constructive Approach
- Tags: Circuits and Systems, Computer-Aided Engineering (CAD CAE) and Design, Electronic and Computer Engineering
- Year: 2008
- Publisher: Springer US
- Edition: 1
- Language: English
- pdf
Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to
- understanding the causes of variability;
- design of test structures for variability characterization;
- statistically rigorous data analysis;
- techniques of design for manufacturability in lithography and in chemical mechanical polishing;
- statistical simulation, analysis, and optimization techniques for improving parametric yield.
Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits.
Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to
- understanding the causes of variability;
- design of test structures for variability characterization;
- statistically rigorous data analysis;
- techniques of design for manufacturability in lithography and in chemical mechanical polishing;
- statistical simulation, analysis, and optimization techniques for improving parametric yield.
Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits.
Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to
- understanding the causes of variability;
- design of test structures for variability characterization;
- statistically rigorous data analysis;
- techniques of design for manufacturability in lithography and in chemical mechanical polishing;
- statistical simulation, analysis, and optimization techniques for improving parametric yield.
Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits.
Content:
Front Matter....Pages I-XIV
Introduction....Pages 1-8
Front End Variability....Pages 11-41
Back End Variability....Pages 43-57
Environmental Variability....Pages 59-82
Test Structures For Variability....Pages 85-99
Statistical Foundations Of Data Analysis And Modeling....Pages 101-123
Lithography Enhancement Techniques....Pages 127-154
Ensuring Interconnect Planarity....Pages 155-164
Statistical Circuit Analysis....Pages 167-200
Statistical Static Timing Analysis....Pages 201-237
Leakage Variability And Joint Parametric Yield....Pages 239-250
Parametric Yield Optimization....Pages 251-277
Conclusions....Pages 279-280
Back Matter....Pages 281-316
Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to
- understanding the causes of variability;
- design of test structures for variability characterization;
- statistically rigorous data analysis;
- techniques of design for manufacturability in lithography and in chemical mechanical polishing;
- statistical simulation, analysis, and optimization techniques for improving parametric yield.
Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits.
Content:
Front Matter....Pages I-XIV
Introduction....Pages 1-8
Front End Variability....Pages 11-41
Back End Variability....Pages 43-57
Environmental Variability....Pages 59-82
Test Structures For Variability....Pages 85-99
Statistical Foundations Of Data Analysis And Modeling....Pages 101-123
Lithography Enhancement Techniques....Pages 127-154
Ensuring Interconnect Planarity....Pages 155-164
Statistical Circuit Analysis....Pages 167-200
Statistical Static Timing Analysis....Pages 201-237
Leakage Variability And Joint Parametric Yield....Pages 239-250
Parametric Yield Optimization....Pages 251-277
Conclusions....Pages 279-280
Back Matter....Pages 281-316
....