Ebook: Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.

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Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.

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Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.
Content:
Front Matter....Pages i-xx
Introduction....Pages 1-8
Front Matter....Pages 9-9
Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transport....Pages 11-30
Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy....Pages 31-87
Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics....Pages 88-112
Principles of Kelvin Probe Force Microscopy....Pages 113-131
Frequency-Dependent Transport Imaging by Scanning Probe Microscopy....Pages 132-172
Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy....Pages 173-214
Principles of Near-Field Microwave Microscopy....Pages 215-253
Electromagnetic Singularities and Resonances in Near-Field Optical Probes....Pages 254-279
Electrochemical SPM....Pages 280-314
Near-Field High-Frequency Probing....Pages 315-345
Front Matter....Pages 347-347
Scanning Probe Microscopy on Low-Dimensional Electron Systems in III–V Semiconductors....Pages 349-371
Spin-Polarized Scanning Tunneling Microscopy....Pages 372-394
Scanning Probe Measurements of Electron Transport in Molecules....Pages 395-422
Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devices....Pages 423-439
Conductance AFM Measurements of Transport Through Nanotubes and Nanotube Networks....Pages 440-454
Theory of Scanning Probe Microscopy....Pages 455-479
Multi-Probe Scanning Tunneling Microscopy....Pages 480-505
Dynamic Force Microscopy and Spectroscopy in Vacuum....Pages 506-533
Scanning Tunneling Microscopy and Spectroscopy of Manganites....Pages 534-558
Front Matter....Pages 559-559
Scanning Voltage Microscopy....Pages 561-600
Electrical Scanning Probe Microscopy of Biomolecules on Surfaces and at Interfaces....Pages 601-614
Electromechanical Behavior in Biological Systems at the Nanoscale....Pages 615-633
Scanning Capacitance Microscopy....Pages 634-662
Kelvin Probe Force Microscopy of Semiconductors....Pages 663-689
Nanoscale Characterization of Electronic and Electrical Properties of III-Nitrides by Scanning Probe Microscopy....Pages 690-714
Electron Flow Through Molecular Structures....Pages 715-745
Electrical Characterization of Perovskite Nanostructures by SPM....Pages 746-775
SPM Measurements of Electric Properties of Organic Molecules....Pages 776-787
High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices....Pages 788-830
Front Matter....Pages 831-831
Electrical SPM-Based Nanofabrication Techniques....Pages 833-857
Fundamental Science and Lithographic Applications of Scanning Probe Oxidation....Pages 858-879
UHV-STM Nanofabrication on Silicon....Pages 880-905
Ferroelectric Lithography....Pages 906-928
Patterned Self-Assembled Monolayers via Scanning Probe Lithography....Pages 929-942
Resistive Probe Storage: Read/Write Mechanism....Pages 943-973
Back Matter....Pages 974-980

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Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.
Content:
Front Matter....Pages i-xx
Introduction....Pages 1-8
Front Matter....Pages 9-9
Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transport....Pages 11-30
Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy....Pages 31-87
Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics....Pages 88-112
Principles of Kelvin Probe Force Microscopy....Pages 113-131
Frequency-Dependent Transport Imaging by Scanning Probe Microscopy....Pages 132-172
Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy....Pages 173-214
Principles of Near-Field Microwave Microscopy....Pages 215-253
Electromagnetic Singularities and Resonances in Near-Field Optical Probes....Pages 254-279
Electrochemical SPM....Pages 280-314
Near-Field High-Frequency Probing....Pages 315-345
Front Matter....Pages 347-347
Scanning Probe Microscopy on Low-Dimensional Electron Systems in III–V Semiconductors....Pages 349-371
Spin-Polarized Scanning Tunneling Microscopy....Pages 372-394
Scanning Probe Measurements of Electron Transport in Molecules....Pages 395-422
Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devices....Pages 423-439
Conductance AFM Measurements of Transport Through Nanotubes and Nanotube Networks....Pages 440-454
Theory of Scanning Probe Microscopy....Pages 455-479
Multi-Probe Scanning Tunneling Microscopy....Pages 480-505
Dynamic Force Microscopy and Spectroscopy in Vacuum....Pages 506-533
Scanning Tunneling Microscopy and Spectroscopy of Manganites....Pages 534-558
Front Matter....Pages 559-559
Scanning Voltage Microscopy....Pages 561-600
Electrical Scanning Probe Microscopy of Biomolecules on Surfaces and at Interfaces....Pages 601-614
Electromechanical Behavior in Biological Systems at the Nanoscale....Pages 615-633
Scanning Capacitance Microscopy....Pages 634-662
Kelvin Probe Force Microscopy of Semiconductors....Pages 663-689
Nanoscale Characterization of Electronic and Electrical Properties of III-Nitrides by Scanning Probe Microscopy....Pages 690-714
Electron Flow Through Molecular Structures....Pages 715-745
Electrical Characterization of Perovskite Nanostructures by SPM....Pages 746-775
SPM Measurements of Electric Properties of Organic Molecules....Pages 776-787
High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices....Pages 788-830
Front Matter....Pages 831-831
Electrical SPM-Based Nanofabrication Techniques....Pages 833-857
Fundamental Science and Lithographic Applications of Scanning Probe Oxidation....Pages 858-879
UHV-STM Nanofabrication on Silicon....Pages 880-905
Ferroelectric Lithography....Pages 906-928
Patterned Self-Assembled Monolayers via Scanning Probe Lithography....Pages 929-942
Resistive Probe Storage: Read/Write Mechanism....Pages 943-973
Back Matter....Pages 974-980
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