Ebook: Oscillation-Based Test in Mixed-Signal Circuits
- Tags: Circuits and Systems, Electronic and Computer Engineering, Engineering Design, Electronics and Microelectronics Instrumentation
- Series: Frontiers in Electronic Testing 36
- Year: 2006
- Publisher: Springer Netherlands
- Edition: 1
- Language: English
- pdf
Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results here presented allow to assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.
Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short.
The results presented here assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.
The author, Jos? Luis Huertas, is Director of the Instituto de Microelectronica de Sevilla in Spain. He has edited one book on Testing for Kluwer, published in October 2004, and was series editor for the three book series from the European Mixed-Signal Initiative for Electronic System Design.
Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short.
The results presented here assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.
The author, Jos? Luis Huertas, is Director of the Instituto de Microelectronica de Sevilla in Spain. He has edited one book on Testing for Kluwer, published in October 2004, and was series editor for the three book series from the European Mixed-Signal Initiative for Electronic System Design.
Content:
Front Matter....Pages I-XV
Oscillation-Based Test Methodology....Pages 1-48
Mathematical Review of Non-linear Oscillators....Pages 49-95
OBT Methodology for Discrete-Time Filters....Pages 97-156
OBT Methodology for discrete-time ?? Modulators....Pages 157-203
OBT Implementation in Discrete-Time Filters....Pages 205-231
Practical regards for OBT-OBIST implementation....Pages 233-295
OBT-OBIST silicon validation....Pages 297-358
Back Matter....Pages 359-452
Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short.
The results presented here assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.
The author, Jos? Luis Huertas, is Director of the Instituto de Microelectronica de Sevilla in Spain. He has edited one book on Testing for Kluwer, published in October 2004, and was series editor for the three book series from the European Mixed-Signal Initiative for Electronic System Design.
Content:
Front Matter....Pages I-XV
Oscillation-Based Test Methodology....Pages 1-48
Mathematical Review of Non-linear Oscillators....Pages 49-95
OBT Methodology for Discrete-Time Filters....Pages 97-156
OBT Methodology for discrete-time ?? Modulators....Pages 157-203
OBT Implementation in Discrete-Time Filters....Pages 205-231
Practical regards for OBT-OBIST implementation....Pages 233-295
OBT-OBIST silicon validation....Pages 297-358
Back Matter....Pages 359-452
....