Ebook: Introduction to Rare Event Simulation
Author: James Antonio Bucklew (auth.)
- Tags: Statistics for Engineering Physics Computer Science Chemistry and Earth Sciences, Computer Communication Networks, Simulation and Modeling, Operations Research Management Science, Appl.Mathematics/Computational Methods of Engineering
- Series: Springer Series in Statistics
- Year: 2004
- Publisher: Springer-Verlag New York
- Edition: 1
- Language: English
- pdf
This book presents a unified theory of rare event simulation and the variance reduction technique known as importance sampling from the point of view of the probabilistic theory of large deviations. This perspective allows us to view a vast assortment of simulation problems from a unified single perspective. It gives a great deal of insight into the fundamental nature of rare event simulation.
Until now, this area has a reputation among simulation practitioners of requiring a great deal of technical and probabilistic expertise. This text keeps the mathematical preliminaries to a minimum with the only prerequisite being a single large deviation theory result that is given and proved in the text. Large deviation theory is a burgeoning area of probability theory and many of the results in it can be applied to simulation problems. Rather than try to be as complete as possible in the exposition of all possible aspects of the available theory, the book concentrates on demonstrating the methodology and the principal ideas in a fairly simple setting.
The book contains over 50 figures and detailed simulation case studies covering a wide variety of application areas including statistics, telecommunications, and queueing systems.
James A. Bucklew holds the rank of Professor with appointments in the Department of Electrical and Computer Engineering and in the Department of Mathematics at the University of Wisconsin-Madison. He is a Fellow of the Institute of Electrical and Electronics Engineers and the author of Large Deviation Techniques in Decision, Simulation, and Estimation.
This book presents a unified theory of rare event simulation and the variance reduction technique known as importance sampling from the point of view of the probabilistic theory of large deviations. This perspective allows us to view a vast assortment of simulation problems from a unified single perspective. It gives a great deal of insight into the fundamental nature of rare event simulation.
Until now, this area has a reputation among simulation practitioners of requiring a great deal of technical and probabilistic expertise. This text keeps the mathematical preliminaries to a minimum with the only prerequisite being a single large deviation theory result that is given and proved in the text. Large deviation theory is a burgeoning area of probability theory and many of the results in it can be applied to simulation problems. Rather than try to be as complete as possible in the exposition of all possible aspects of the available theory, the book concentrates on demonstrating the methodology and the principal ideas in a fairly simple setting.
The book contains over 50 figures and detailed simulation case studies covering a wide variety of application areas including statistics, telecommunications, and queueing systems.
James A. Bucklew holds the rank of Professor with appointments in the Department of Electrical and Computer Engineering and in the Department of Mathematics at the University of Wisconsin-Madison. He is a Fellow of the Institute of Electrical and Electronics Engineers and the author of Large Deviation Techniques in Decision, Simulation, and Estimation.
This book presents a unified theory of rare event simulation and the variance reduction technique known as importance sampling from the point of view of the probabilistic theory of large deviations. This perspective allows us to view a vast assortment of simulation problems from a unified single perspective. It gives a great deal of insight into the fundamental nature of rare event simulation.
Until now, this area has a reputation among simulation practitioners of requiring a great deal of technical and probabilistic expertise. This text keeps the mathematical preliminaries to a minimum with the only prerequisite being a single large deviation theory result that is given and proved in the text. Large deviation theory is a burgeoning area of probability theory and many of the results in it can be applied to simulation problems. Rather than try to be as complete as possible in the exposition of all possible aspects of the available theory, the book concentrates on demonstrating the methodology and the principal ideas in a fairly simple setting.
The book contains over 50 figures and detailed simulation case studies covering a wide variety of application areas including statistics, telecommunications, and queueing systems.
James A. Bucklew holds the rank of Professor with appointments in the Department of Electrical and Computer Engineering and in the Department of Mathematics at the University of Wisconsin-Madison. He is a Fellow of the Institute of Electrical and Electronics Engineers and the author of Large Deviation Techniques in Decision, Simulation, and Estimation.
Content:
Front Matter....Pages I-XI
Random Number Generation....Pages 1-16
Stochastic Models....Pages 17-25
Large Deviation Theory....Pages 27-55
Importance Sampling....Pages 57-73
The Large Deviation Theory of Importance Sampling Estimators....Pages 75-122
Variance Rate Theory of Conditional Importance Sampling Estimators....Pages 123-139
The Large Deviations of Bias Point Selection....Pages 141-149
Chernoff’s Bound and Asymptotic Expansions....Pages 151-166
Gaussian Systems....Pages 167-182
Universal Simulation Distributions....Pages 183-193
Rare Event Simulation for Level Crossing and Queueing Models....Pages 195-206
Blind Simulation....Pages 207-215
The (Over-Under) Biasing Problem in Importance Sampling....Pages 217-219
Tools and Techniques for Importance Sampling....Pages 221-243
Back Matter....Pages 245-262
This book presents a unified theory of rare event simulation and the variance reduction technique known as importance sampling from the point of view of the probabilistic theory of large deviations. This perspective allows us to view a vast assortment of simulation problems from a unified single perspective. It gives a great deal of insight into the fundamental nature of rare event simulation.
Until now, this area has a reputation among simulation practitioners of requiring a great deal of technical and probabilistic expertise. This text keeps the mathematical preliminaries to a minimum with the only prerequisite being a single large deviation theory result that is given and proved in the text. Large deviation theory is a burgeoning area of probability theory and many of the results in it can be applied to simulation problems. Rather than try to be as complete as possible in the exposition of all possible aspects of the available theory, the book concentrates on demonstrating the methodology and the principal ideas in a fairly simple setting.
The book contains over 50 figures and detailed simulation case studies covering a wide variety of application areas including statistics, telecommunications, and queueing systems.
James A. Bucklew holds the rank of Professor with appointments in the Department of Electrical and Computer Engineering and in the Department of Mathematics at the University of Wisconsin-Madison. He is a Fellow of the Institute of Electrical and Electronics Engineers and the author of Large Deviation Techniques in Decision, Simulation, and Estimation.
Content:
Front Matter....Pages I-XI
Random Number Generation....Pages 1-16
Stochastic Models....Pages 17-25
Large Deviation Theory....Pages 27-55
Importance Sampling....Pages 57-73
The Large Deviation Theory of Importance Sampling Estimators....Pages 75-122
Variance Rate Theory of Conditional Importance Sampling Estimators....Pages 123-139
The Large Deviations of Bias Point Selection....Pages 141-149
Chernoff’s Bound and Asymptotic Expansions....Pages 151-166
Gaussian Systems....Pages 167-182
Universal Simulation Distributions....Pages 183-193
Rare Event Simulation for Level Crossing and Queueing Models....Pages 195-206
Blind Simulation....Pages 207-215
The (Over-Under) Biasing Problem in Importance Sampling....Pages 217-219
Tools and Techniques for Importance Sampling....Pages 221-243
Back Matter....Pages 245-262
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