Ebook: The Boundary — Scan Handbook

In February of 1990, the balloting process for the IEEE proposed standard P1149.1 was completed creating IEEE Std 1149.1-1990. Later that summer, in record time, the standard won ratification as an ANSI standard as well. This completed over six years of intensive cooperative effort by a diverse group of people who share a vision on solving some of the severe testing problems that exist now and are steadily getting worse. Early in this process, someone asked me if 1 thought that the P1l49.l effort would ever bear fruit. 1 responded somewhat glibly that "it was anyone's guess". Well, it wasn't anyone's guess, but rather the faith of a few individuals in the proposition that many testing problems could be solved if a multifaceted industry could agree on a standard for all to follow. Four of these individuals stand out; they are Harry Bleeker, Colin Maunder, Rodham Tulloss, and Lee Whetsel. In that I am convinced that the 1149.1 standard is the most significant testing development in the last 20 years, I personally feel a debt of gratitude to them and all the people who labored on the various Working Groups in its creation.

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The fundamental 1149.1 standard is now over 13 years old and has a large infrastructure of support in the electronics industry. Today, a majority of custom ICs and Programmable Logic Devices have 1149.1 implementations. The Boundary-Scan Handbook, Third Edition updates the information about 1149.1, which has been revised as recently as 2001. It contains a description of the 1149.4 "Analog Boundary-Scan" standard, and gives a tutorial on analog testing technology. It then introduces the recently released IEEE 1149.6 "Advanced I/O" standard, which extends Boundary-Scan to deal with AC-coupled differential signaling now becoming common in higher performance system. Finally, since a board test system provides a suitable environment for programming non-volatile Programmable Logic Devices, the IEEE 1532 standard is described which extends the 1149.1 access protocol into the device programming domain. This forms an essential tools for testing boards and systems of the future.

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The fundamental 1149.1 standard is now over 13 years old and has a large infrastructure of support in the electronics industry. Today, a majority of custom ICs and Programmable Logic Devices have 1149.1 implementations. The Boundary-Scan Handbook, Third Edition updates the information about 1149.1, which has been revised as recently as 2001. It contains a description of the 1149.4 "Analog Boundary-Scan" standard, and gives a tutorial on analog testing technology. It then introduces the recently released IEEE 1149.6 "Advanced I/O" standard, which extends Boundary-Scan to deal with AC-coupled differential signaling now becoming common in higher performance system. Finally, since a board test system provides a suitable environment for programming non-volatile Programmable Logic Devices, the IEEE 1532 standard is described which extends the 1149.1 access protocol into the device programming domain. This forms an essential tools for testing boards and systems of the future.

Content:
Front Matter....Pages i-xxvii
Boundary-Scan Basics and Vocabulary....Pages 1-47
Boundary-Scan Description Language (BSDL)....Pages 49-106
Boundary-Scan Testing....Pages 107-147
Advanced Boundary-Scan Topics....Pages 149-169
Design for Boundary-Scan Test....Pages 171-200
Analog Measurement Basics....Pages 201-224
IEEE 1149.4: Analog Boundary-Scan....Pages 225-266
IEEE 1149.6: Testing Advanced I/O....Pages 267-318
IEEE 1532: In-System Configuration....Pages 319-343
Back Matter....Pages 345-373

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The fundamental 1149.1 standard is now over 13 years old and has a large infrastructure of support in the electronics industry. Today, a majority of custom ICs and Programmable Logic Devices have 1149.1 implementations. The Boundary-Scan Handbook, Third Edition updates the information about 1149.1, which has been revised as recently as 2001. It contains a description of the 1149.4 "Analog Boundary-Scan" standard, and gives a tutorial on analog testing technology. It then introduces the recently released IEEE 1149.6 "Advanced I/O" standard, which extends Boundary-Scan to deal with AC-coupled differential signaling now becoming common in higher performance system. Finally, since a board test system provides a suitable environment for programming non-volatile Programmable Logic Devices, the IEEE 1532 standard is described which extends the 1149.1 access protocol into the device programming domain. This forms an essential tools for testing boards and systems of the future.

Content:
Front Matter....Pages i-xxvii
Boundary-Scan Basics and Vocabulary....Pages 1-47
Boundary-Scan Description Language (BSDL)....Pages 49-106
Boundary-Scan Testing....Pages 107-147
Advanced Boundary-Scan Topics....Pages 149-169
Design for Boundary-Scan Test....Pages 171-200
Analog Measurement Basics....Pages 201-224
IEEE 1149.4: Analog Boundary-Scan....Pages 225-266
IEEE 1149.6: Testing Advanced I/O....Pages 267-318
IEEE 1532: In-System Configuration....Pages 319-343
Back Matter....Pages 345-373
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