Ebook: Reliability of Electronic Components: A Practical Guide to Electronic Systems Manufacturing

The objective of this book is to better understand why components fail, addressing the needs of engineers who will apply reliability principles in design, manufacture, testing, and field service. It so contributes to new approaches and the development of electronic and telecommunications component reliability. As a reference source, it summarizes the knowledge on failure modes, degradation and mechanisms, including a survey of accelerated testing, achieving better reliability, total quality topics, screening tests and prediction methods. A detailed index, a glossary, acronym lists, reliability dictionaries and a rich specific bibliography round the benefit offered by the book. The technical level suites to senior and graduate students, as well as to experts and managers in industries.

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The objective of this book is to better understand why components fail, addressing the needs of engineers who will apply reliability principles in design, manufacture, testing, and field service. It so contributes to new approaches and the development of electronic and telecommunications component reliability. As a reference source, it summarizes the knowledge on failure modes, degradation and mechanisms, including a survey of accelerated testing, achieving better reliability, total quality topics, screening tests and prediction methods. A detailed index, a glossary, acronym lists, reliability dictionaries and a rich specific bibliography round the benefit offered by the book. The technical level suites to senior and graduate students, as well as to experts and managers in industries.

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The objective of this book is to better understand why components fail, addressing the needs of engineers who will apply reliability principles in design, manufacture, testing, and field service. It so contributes to new approaches and the development of electronic and telecommunications component reliability. As a reference source, it summarizes the knowledge on failure modes, degradation and mechanisms, including a survey of accelerated testing, achieving better reliability, total quality topics, screening tests and prediction methods. A detailed index, a glossary, acronym lists, reliability dictionaries and a rich specific bibliography round the benefit offered by the book. The technical level suites to senior and graduate students, as well as to experts and managers in industries.
Content:
Front Matter....Pages I-XLI
Introduction....Pages 1-42
State of the art in the reliability of electronic components....Pages 43-92
Reliability of passive electronic parts....Pages 93-144
Reliability of diodes....Pages 145-170
Reliability of silicon power transistors....Pages 171-196
Reliability of thyristors....Pages 197-214
Reliability of monolithic integrated circuits....Pages 215-246
Reliability of hybrid integrated circuits....Pages 247-276
Reliability of memories and microprocessors....Pages 277-312
Reliability of optoelectronic components....Pages 313-328
Noise and reliability....Pages 329-338
Plastic package and reliability....Pages 339-362
Test and testability of logic ICs....Pages 363-380
Failure analysis....Pages 381-412
Appendix....Pages 413-424
Back Matter....Pages 425-509

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The objective of this book is to better understand why components fail, addressing the needs of engineers who will apply reliability principles in design, manufacture, testing, and field service. It so contributes to new approaches and the development of electronic and telecommunications component reliability. As a reference source, it summarizes the knowledge on failure modes, degradation and mechanisms, including a survey of accelerated testing, achieving better reliability, total quality topics, screening tests and prediction methods. A detailed index, a glossary, acronym lists, reliability dictionaries and a rich specific bibliography round the benefit offered by the book. The technical level suites to senior and graduate students, as well as to experts and managers in industries.
Content:
Front Matter....Pages I-XLI
Introduction....Pages 1-42
State of the art in the reliability of electronic components....Pages 43-92
Reliability of passive electronic parts....Pages 93-144
Reliability of diodes....Pages 145-170
Reliability of silicon power transistors....Pages 171-196
Reliability of thyristors....Pages 197-214
Reliability of monolithic integrated circuits....Pages 215-246
Reliability of hybrid integrated circuits....Pages 247-276
Reliability of memories and microprocessors....Pages 277-312
Reliability of optoelectronic components....Pages 313-328
Noise and reliability....Pages 329-338
Plastic package and reliability....Pages 339-362
Test and testability of logic ICs....Pages 363-380
Failure analysis....Pages 381-412
Appendix....Pages 413-424
Back Matter....Pages 425-509
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