Ebook: Low-K Nanoporous Interdielectrics: Materials, Thin Film Fabrications, Structures and Properties : Materials, Thin Film Fabrications, Structures and Properties
Author: Moonhor Ree, Jinhwan Yoo, Kyuyoung Heo
- Tags: Dielectric films., Microelectronics -- Materials., Porous materials., Interconnects (Integrated circuit technology)
- Series: Nanotechnology Science and Technology
- Year: 2010
- Publisher: Nova Science Publishers
- City: Hauppauge, United States
- Edition: 1
- Language: English
- pdf
The use of low dielectric constant (low-k) interdielectrics in multilevel structure integrated circuits (ICs) can lower line-to-line noise in interconnects and alleviate power dissipation issues by reducing the capacitance between the interconnect conductor lines. Because of these merits, low-k interdielectric materials are currently in high demand in the development of advanced ICs. One important approach to obtaining low-k values is the incorporation of nanopores into dielectrics. This book provides an overview of the methodologies and characterization techniques used for investigating low-k nanoporous interdielectrics.
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