Ebook: Advances in embedded and fan-out wafer level packaging technologies
Author: Keser Beth, Kroehnert Steffen
- Tags: Chip scale packaging, Circuits intégrés--Intégration sur la plaquette, Integrated circuits--Wafer-scale integration, Integrated circuits -- Wafer-scale integration, Circuits intégrés -- Intégration sur la plaquette
- Series: IEEE Press series on microelectronic systems
- Year: 2019
- Publisher: Wiley-IEEE Press
- City: Hoboken, NJ, USA
- Language: English
- pdf
« Embedded and fan-out wafer level packaging (FO-WLP) technologies have been developed across the industry over the past 15 years and have been in high volume manufacturing for nearly a decade. This book covers the advances that have been made in this new packaging technology and discusses the many benefits it provides to the electronic packaging industry and supply chain. It provides a compact overview of the major types of technologies offered in this field, on what is available, how it is processed, what is driving its development, and the pros and cons. Filled with contributions from some of the field's leading experts,??Advances in Embedded and Fan-Out Wafer Level Packaging Technologies??begins with a look at the history of the technology. It then goes on to examine the biggest technology and marketing trends. Other sections are dedicated to chip-first FO-WLP, chip-last FO-WLP, embedded die packaging, materials challenges, equipment challenges, and resulting technology fusions. »--
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