Ebook: High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test
Author: R. Dean Adams
- Genre: Technique
- Series: Frontiers in Electronic Testing
- Year: 2002
- Publisher: Springer
- Edition: 1
- Language: English
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Based on the author's 20 years of experience in memory design, memory reliability development and memory test. Written for the professional and the researcher to help them understand the memories that are being tested.
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