Ebook: Thermal-aware testing of digital VLSI circuits and systems
Author: Chattopadhyay Santanu
- Tags: Integrated circuits -- Very large scale integration -- Testing, Digital integrated circuits -- Testing, Integrated circuits -- Very large scale integration -- Thermal properties, Temperature measurements, Digital integrated circuits -- Testing, Integrated circuits -- Very large scale integration -- Testing, Temperature measurements
- Year: 2018
- Edition: First edition
- Language: English
- pdf
The book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. The book will be suitable for the researchers working on power- and thermal-aware design and test of digital VLSI chips
Abstract:
The book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. The book will be suitable Read more...
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