Ebook: Thermal-Aware Testing of Digital VLSI Circuits and Systems
Author: Santanu Chattopadhyay
- Tags: Integrated circuits -- Very large scale integration -- Testing., Digital integrated circuits -- Testing., Integrated circuits -- Very large scale integration -- Thermal properties., Temperature measurements., TECHNOLOGY & ENGINEERING / Mechanical.
- Series: CRC focus
- Year: 2018
- Publisher: CRC Press
- Edition: 1
- Language: English
- pdf
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.
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