Ebook: Метод объективной оценки искажений мелких деталей в процессе растрирования
Author: Кузнецов Ю.В.
- Genre: Техника // Издательское дело
- Tags: Издательское дело и упаковочное производство, Полиграфия
- Language: Русский
- pdf
Статья. - Опубликована в сборнике IARIGAI, 2008. - №35 - 347-353 c. - Текст англ. Method of objective evaluation the fine Adobe Acrobat документFor objective quantitative measurement of the image fine detail distortion involved by screening the Screening
Distortion Factor (SDF) is proposed. It comprises the norm of an error evaluated by superimposing of the original
and halftoned resolution pattern bitmaps and counting the normalized sum of microdots, which changed their
polarity (from black to white and from white to black) as result of screening. The losses in an image high spatial
frequency component are illustrated by plotting the SDF curves via line test pattern frequency for variety of such
screening process parameters as screen ruling, screening factor, screen and dot geometry, screening algorithm, etc.
Distortion Factor (SDF) is proposed. It comprises the norm of an error evaluated by superimposing of the original
and halftoned resolution pattern bitmaps and counting the normalized sum of microdots, which changed their
polarity (from black to white and from white to black) as result of screening. The losses in an image high spatial
frequency component are illustrated by plotting the SDF curves via line test pattern frequency for variety of such
screening process parameters as screen ruling, screening factor, screen and dot geometry, screening algorithm, etc.
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