Ebook: ISTFA 2007 : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA
Author: ASM International
- Tags: Electronics -- Materials -- Testing -- Congresses. Electronic apparatus and appliances -- Testing -- Congresses. TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- General. TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- Integrated. Electronic apparatus and appliances -- Testing. Electronics -- Materials -- Testing.
- Year: 2007
- Publisher: ASM International
- City: Materials Park, OH, San Jose, Calif.)
- Language: English
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