Ebook: ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis : November 6 - 10, 2005, McEnery Convention Center, San Jose, California
Author: ASM International
- Tags: Elektronik, SWD-ID: 40143466 Fehleranalyse, SWD-ID: 40166089 Kongress Elektronik. Kongress. Prüftechnik.
- Year: 2005
- Publisher: ASM International
- City: Materials Park, Ohio, San Jose, Calif.)
- Language: English
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