Ebook: X-Ray Scattering of Soft Matter

Applications of X-ray scattering to soft matter have advanced considerably within recent years, both conceptually and technically – mature high-power X-ray sources, synchrotrons and rotating anodes, as well as high-speed detectors have become readily available. High-quality time-resolved experiments on polymer structure now can be performed with ease, a major advancement due to the genuine power of the scattering method.

This manual summarizes the analytical power of modern X-ray scattering in the field of soft matter. Description of simple tools that can elucidate the mechanisms of structure evolution in the studied materials is followed by a step-by-step guide and breakdown of the more advanced methods. Data analysis based on clear, unequivocal results is rendered simple and straightforward – with a stress on the carefully planning of the experiments and adequate recording of all required data. To this end, this book serves as a useful ready-reference guide.

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The application of X-ray scattering for the study of soft matter has a long tradition. By shining X-rays on a piece of material, representative structure information is collected in a scattering pattern.Moreover, during the last three decadesX-ray scattering has gained new attractivity, for it developed from a static to a dynamic method. The progress achieved is closely linked to the development of both powerful detectors and brilliant X-ray sources (synchrotron radiation, rotating anode). Such point-focus equipment has replaced older slit-focus equipment (Kratky camera, Rigaku-Denki camera) in many laboratories, and the next step of instrumental progress is already discernible. With the "X-ray free electron laser" (XFEL) it will become possible to study very fast processes like the structure relaxation of elastomers after the removal of mechanical load.Today, structure evolution can be tracked in-situ with a cycle time of less than a second. Moreover, if a polymer part is scanned by the X-ray beam of a microbeam setup, the variation of structure and orientation can be documented with a spatial resolution of 1 чm. For the application of X-rays no special sample preparation is required, and as the beam may travel through air for at least several centimeters, manufacturing or ageing machinery can be integrated in the beamline with ease.