Ebook: Characterization of Microstructures by Analytical Electron Microscopy (AEM)
Author: Prof. Yonghua Rong (auth.)
- Tags: Characterization and Evaluation of Materials, Condensed Matter Physics, Optics Optoelectronics Plasmonics and Optical Devices
- Year: 2012
- Publisher: Springer Berlin Heidelberg
- Language: English
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