Ebook: An Introduction to Mixed-Signal IC Test and Measurement
- Series: The Oxford Series in Electrical and Computer Engineering
- Year: 2011
- Publisher: Oxford University Press
- Edition: 2
- Language: English
- pdf
With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal, and radio-frequency circuits, today's engineer must be fluent in all four circuit types. Written for advanced undergraduate and graduate-level students, as well as engineering professionals, An Introduction to Mixed-Signal IC Test and Measurement, Second Edition, encompasses analog, mixed-signal and radio-frequency circuits tests, with many relevant industrial examples. The text assumes a solid background in analog and digital circuits and a working knowledge of computers and computer programming.
An Introduction to Mixed-Signal IC Test and Measurement, Second Edition, includes examples and illustrations--featuring state-of-the-art industrial technology--to enrich and enliven the text. The book also introduces large-scale mixed-signal circuit and individual circuit tests, discusses the value-added benefits of mixed-signal IC testing to a manufacturer's product, and clearly defines the role of the test engineer.
New to This Edition
* A new chapter on RF Test Methods and Fundamentals of RF Testing
* A new chapter on Clock and Serial Data Communications Channel Measurements
* Coverage of RF load board design
* New coverage of probabilistic reasoning for mixed-signal testing
An Introduction to Mixed-Signal IC Test and Measurement, Second Edition, includes examples and illustrations--featuring state-of-the-art industrial technology--to enrich and enliven the text. The book also introduces large-scale mixed-signal circuit and individual circuit tests, discusses the value-added benefits of mixed-signal IC testing to a manufacturer's product, and clearly defines the role of the test engineer.
New to This Edition
* A new chapter on RF Test Methods and Fundamentals of RF Testing
* A new chapter on Clock and Serial Data Communications Channel Measurements
* Coverage of RF load board design
* New coverage of probabilistic reasoning for mixed-signal testing
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